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Inventor profile of:

Mingchen Sun

City:

Wuhan

Country:

China

Published Applications:

2

Last publication date:

2025-12-04

Recent patent applications by Sun Mingchen

Mingchen Sun from Wuhan, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-12-04

US20250370038A1

METHOD AND TESTING SYSTEM FOR TESTING SEMICONDUCTOR CHIP PACKAGES

#2 | 2025-12-04

US20250369843A1

METHOD AND TESTING SYSTEM FOR TESTING SEMICONDUCTOR CHIP PACKAGES

InventorID:

7644191 ⎘