Niranjan SAIKUMAR

City:

Rotterdam

Country:

Netherlands

Published Applications:

Last publication date:

2025-12-18

Recent patent applications by SAIKUMAR Niranjan

Niranjan SAIKUMAR from Rotterdam, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-12-18

US20250383369A1

Physics

METHOD OF AND SCANNING PROBE MICROSCOPY SYSTEM FOR MEASURING A TOPOGRAPHY OF A SIDE WALL OF A STRUCTURE ON A SURFACE OF A SUBSTRATE

InventorID:

7656786 ⎘