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Inventor profile of:

Stephan Nickell

City:

Aalen

Country:

Germany

Published Applications:

1

Last publication date:

2025-12-18

Recent patent applications by Nickell Stephan

Stephan Nickell from Aalen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-12-18

US20250385069A1

MONITORING OF IMAGING PARAMETERS OF SCANNING ELECTRON MICROSCOPY

InventorID:

7658292 ⎘