Wake Forest, North Carolina
United States
33
2025-10-30
The entities that hold a legal rights for patent applications filed by inventor GARDINER Daniel Stephen:
Daniel Stephen GARDINER from Wake Forest, US has applied for patents for these inventions. The list has both pending applications and granted patents:
AUTOMATED APPLICATION OF DRIFT CORRECTION TO SAMPLE STUDIED UNDER ELECTRON MICROSCOPE
#2 | 2025-10-16SYSTEMS AND METHODS FOR TEMPERATURE CONTROL IN ELECTRON MICROSCOPY
#3 | 2025-08-14AUTOMATED APPLICATION OF DRIFT CORRECTION TO SAMPLE STUDIED UNDER ELECTRON MICROSCOPE
#4 | 2025-02-13SYSTEMS AND METHODS OF METADATA AND IMAGE MANAGEMENT FOR REVIEWING DATA FROM TRANSMISSION ELECTRON MICROSCOPE (TEM) SESSIONS
#5 | 2025-01-23METHODS AND SYSTEMS FOR SELECTIVELY MANAGING IMAGE AND METADATA FROM TRANSMISSION ELECTRON MICROSCOPE (TEM) SESSIONS AT MULTIPLE TEMPORAL OR SPATIAL RESOLUTIONS
#6 | 2024-08-08Automated application of drift correction to sample studied under electron microscope
#7 | 2024-06-13AUTOMATED APPLICATION OF DRIFT CORRECTION TO SAMPLE STUDIED UNDER ELECTRON MICROSCOPE
#8 | 2023-12-28Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
#9 | 2023-02-16Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
#10 | 2022-12-22Automated application of drift correction to sample studied under electron microscope
#11 | 2022-11-24Automated application of drift correction to sample studied under electron microscope
#12 | 2022-10-13Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
#13 | 2022-08-04Automated application of drift correction to sample studied under electron microscope
#14 | 2022-04-28Electron microscope sample holder fluid handling with independent pressure and flow control
#15 | 2022-03-31Automated application of drift correction to sample studied under electron microscope
#16 | 2021-07-29Automated application of drift correction to sample studied under electron microscope
#17 | 2021-04-15Automated application of drift correction to sample studied under electron microscope
#18 | 2020-12-31MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samples
#19 | 2020-05-07Electron microscope sample holder fluid handling with independent pressure and flow control
#20 | 2020-02-06MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples
#21 | 2019-03-14MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples
#22 | 2018-11-15Method for enabling modular part replacement within an electron microscope sample holder
#23 | 2018-10-11Method for optimizing fluid flow across a sample within an electron microscope sample holder
#24 | 2018-04-05Method for forming an electrical connection to a sample support in an electron microscope holder
#25 | 2018-03-08Method for monitoring environmental states of a microscope sample with an electron microscope sample holder
#26 | 2017-04-06Method for optimizing fluid flow across a sample within an electron microscope sample holder
#27 | 2017-03-02MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples
#28 | 2017-02-23Method for forming an electrical connection to a sample support in an electron microscope holder
#29 | 2016-11-17Method for enabling modular part replacement within an electron microscope sample holder
#30 | 2015-12-03Method for optimizing fluid flow across a sample within an electron microscope sample holder
#31 | 2015-08-20Device for monitoring environmental states of a microscope sample with an electron microscope sample holder
#32 | 2014-09-18DEVICE FOR IMAGING ELECTRON MICROSCOPE ENVIRONMENTAL SAMPLE SUPPORTS IN A MICROFLUIDIC OR ELECTROCHEMICAL CHAMBER WITH AN OPTICAL MICROSCOPE
#33 | 2014-05-22Method for forming an electrical connection to an sample support in an electron microscope holder
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