Somers, New York
United States
54
2019-11-28
The entities that hold a legal rights for patent applications filed by inventor Warnock James D.:
James D. Warnock from Somers, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Pessimism reduction in cross-talk noise determination used in integrated circuit design
#2 | 2019-09-19Operating pulsed latches on a variable power supply
#3 | 2019-01-31Priority based circuit synthesis
#4 | 2018-07-12Operating pulsed latches on a variable power supply
#5 | 2018-04-05Adjusting scan connections based on scan control locations
#6 | 2018-03-29Programmable integrated circuit standard cell
#7 | 2018-03-29Programmable integrated circuit standard cell
#8 | 2018-03-08Programmable clock division methodology with in-context frequency checking
#9 | 2017-12-07Early analysis and mitigation of self-heating in design flows
#10 | 2017-11-30Programmable clock division methodology with in-context frequency checking
#11 | 2017-09-12Initializing scannable and non-scannable latches from a common clock buffer
#12 | 2017-09-12Initializing scannable and non-scannable latches from a common clock buffer
#13 | 2017-06-22Adjusting scan connections based on scan control locations
#14 | 2017-06-08Priority based circuit synthesis
#15 | 2017-05-25On-chip sensor for monitoring active circuits on integrated circuit (IC) chips
#16 | 2017-05-11Debugging scan latch circuits using flip devices
#17 | 2017-05-04Programmable delay circuit including hybrid fin field effect transistors (finFETs)
#18 | 2017-03-30Debugging scan latch circuits using flip devices
#19 | 2017-02-02Performance-screen ring oscillator (PSRO) using an integrated circuit test signal distribution network
#20 | 2017-02-02Performance-screen ring oscillator (PSRO) using an integrated circuit test signal distribution network
#21 | 2017-01-12Programmable delay circuit including hybrid fin field effect transistors (finFETs)
#22 | 2017-01-12Programmable delay circuit including hybrid fin field effect transistors (finFETs)
#23 | 2017-01-12Validating variation of timing constraint measurements
#24 | 2017-01-12Validating variation of timing constraint measurements
#25 | 2016-11-10Debugging scan latch circuits using flip devices
#26 | 2016-08-04Method for an efficient modeling of the impact of device-level self-heating on electromigration limited current specifications
#27 | 2016-04-28Signal distribution in integrated circuit using optical through silicon via
#28 | 2016-04-28Signal distribution in integrated circuit using optical through silicon via
#29 | 2015-03-26Margin improvement for configurable local clock buffer
#30 | 2014-10-28Optimal spare latch selection for metal-only ECOs
#31 | 2014-07-17Power grid generation through modification of an initial power grid based on power grid analysis
#32 | 2014-07-17Clock skew analysis and optimization
#33 | 2014-05-22CONTINUOUS VIA FOR POWER GRID
#34 | 2014-05-22CONTINUOUS VIA FOR POWER GRID
#35 | 2013-11-19Device-based random variability modeling in timing analysis
#36 | 2011-05-05Apparatus and method for hardening latches in SOI CMOS devices
#37 | 2009-08-06Low-power multi-output local clock buffer
#38 | 2009-08-06LSSD compatibility for GSD unified global clock buffers
#39 | 2009-05-28Apparatus and method for hardening latches in SOI CMOS devices
#40 | 2009-04-16Structure for Transmission Gate Multiplexer
#41 | 2009-03-19Transmission gate multiplexer
#42 | 2008-12-16Transmission gate multiplexer
#43 | 2008-12-11Structure for a configurable low power high fan-in multiplexer
#44 | 2008-12-11Method and apparatus for a configurable low power high fan-in multiplexer
#45 | 2008-05-01Leakage power estimation
#46 | 2008-05-01Programmable local clock buffer
#47 | 2008-05-01Pulsed local clock buffer (LCB) characterization ring oscillator
#48 | 2008-05-01Scannable dynamic logic latch circuit
#49 | 2008-03-27PARAMETERIZED SEMICONDUCTOR CHIP CELLS AND OPTIMIZATION OF THE SAME
#50 | 2006-10-26High-speed level sensitive scan design test scheme with pipelined test clocks
#51 | 2006-08-01Parallel field effect transistor structure having a body contact
#52 | 2005-11-03METHOD AND STRUCTURE FOR CONNECTING GROUND/POWER NETWORKS TO PREVENT CHARGE DAMAGE IN SILICON ON INSULATOR
#53 | 2005-03-31Methods for modeling latch transparency
#54 | 2005-03-31Methods for modeling latch transparency
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