Jan Botsch

City:

Berlin

Country:

Germany

Published Applications:

Last publication date:

2026-04-30

Top Assignees for applications by Jan Botsch

The entities that hold a legal rights for patent applications filed by inventor Botsch Jan:

Jan Botsch from Berlin, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

GENERATION AND ASSESSMENT OF STRIPED LIGHTING ILLUMINATED DAMAGE DETECTION DATA

COMBINED CONFIDENCE METRIC-BASED DETERMINATION OF INPUT SUITABILITY FOR INPUTS GENERATED BY COMPLEX SYSTEMS

TECHNIQUES AND MECHANISMS FOR STRIPED LIGHTING DAMAGE DETECTION

GENERATING COMBINED CONFIDENCE METRICS FOR COMPLEX SYSTEMS

GENERATING COMBINED CONFIDENCE METRICS FOR COMPLEX DAMAGE ASSESSMENT SYSTEMS

InventorID:

7736519 ⎘