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Inventor profile of:

Yoonsung Bae

City:

Suwon-si

Country:

South Korea

Published Applications:

1

Last publication date:

2026-04-02

Recent patent applications by Bae Yoonsung

Yoonsung Bae from Suwon-si, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-04-02

US20260094260A1

METHOD FOR ESTIMATING CAUSE OF DEFECTS IN SEMICONDUCTOR WAFERS

InventorID:

7748971 ⎘