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Inventor profile of:

Fabian Meyer

City:

Rottweil

Country:

Germany

Published Applications:

1

Last publication date:

2026-05-21

Recent patent applications by Meyer Fabian

Fabian Meyer from Rottweil, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-05-21

US20260141673A1

Method for recognizing patterns in image data

InventorID:

7792032 ⎘