Jon FLEIG

City:

Rochester, New York

Country:

United States

Published Applications:

Last publication date:

2014-06-05

Top Assignees for applications by Jon FLEIG

The entities that hold a legal rights for patent applications filed by inventor FLEIG Jon:

Jon FLEIG from Rochester, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Integrated wavefront sensor and profilometer

Method for calibrating the geometry of a multi-axis metrology system

InventorID:

785058 ⎘