Wiesbaden
Germany
6
2017-08-17
The entities that hold a legal rights for patent applications filed by inventor Michelt Berthold:
Berthold Michelt from Wiesbaden, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring head
#2 | 2015-09-17Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring head
#3 | 2014-12-18Optical measuring device and method for acquiring in situ a stage height between a support and an edge region of an object
#4 | 2013-02-07Monitoring apparatus and method for in-situ measurement of wafer thicknesses for monitoring the thinning of semiconductor wafers and thinning apparatus comprising a wet etching apparatus and a monitoring apparatus
#5 | 2012-12-20Test device for testing a bonding layer between wafer-shaped samples and test process for testing the bonding layer
#6 | 2007-10-18Device and method for the contactless measurement of at least one curved surface
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