Inventor profile of:

Stephan Uhlemann

City:

Heidelberg

Country:

Germany

Published Applications:

14

Last publication date:

2021-02-18

Top Assignees for applications by Stephan Uhlemann

The entities that hold a legal rights for patent applications filed by inventor Uhlemann Stephan:

Recent patent applications by Uhlemann Stephan

Stephan Uhlemann from Heidelberg, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2021-02-18
US20210050179A1
Electricity

Particle-optical corrector which is free from axial aberrations of sixth order and electron microscope with corrector

#2 | 2017-10-05
US20170287674A1
Electricity

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

#3 | 2016-04-21
US20160111251A1
Electricity

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

#4 | 2014-06-12
US20140158902A1
Electricity

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

#5 | 2012-06-21
US20120153147A1
Electricity

Corrector

#6 | 2012-05-03
US20120104252A1
Electricity

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

#7 | 2010-07-22
US20100181479A1
Electricity

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

#8 | 2009-05-28
US20090134339A1
Electricity

Electron-optical corrector for aplanatic imaging systems

#9 | 2008-11-27
US20080290273A1
Electricity

Monochromator and radiation source with monochromator

#10 | 2008-10-30
US20080265172A1
Electricity

Electron-optical corrector for an aplanatic imaging system

#11 | 2008-03-06
US20080054184A1
Electricity

Particle-optical systems and arrangements and particle-optical components for such systems and arrangements

#12 | 2006-11-14
US10638328
-

Beam guiding arrangement, imaging method, electron microscopy system and electron lithography system

#13 | 2005-06-07
US10185729
-

Examining system for the particle-optical imaging of an object, deflector for charged particles as well as method for the operation of the same

#14 | 2005-02-17
US20050035299A1
Electricity

Lens array with a laterally movable optical axis for corpuscular rays

InventorID:

792322 ⎘