Tokyo
Japan
18
2025-01-30
The entities that hold a legal rights for patent applications filed by inventor Shimura Kei:
Kei Shimura from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Far-Infrared Spectroscopic Device, and Far-Infrared Spectroscopic Method
#2 | 2024-08-29Far-Infrared Spectroscopy Device and Sample Adapter
#3 | 2023-07-27Far-infrared spectroscopy device
#4 | 2022-12-29Far-infrared spectroscopy device and far-infrared spectroscopy method
#5 | 2021-12-09Far-infrared light source and far-infrared spectrometer
#6 | 2021-10-07Far-infrared spectroscopy device
#7 | 2021-05-06Far-infrared spectroscopic device and far-infrared spectroscopic method
#8 | 2020-11-26Far-Infrared Light Source and Far-Infrared Spectrometer
#9 | 2020-03-19Far-infrared spectroscopy device
#10 | 2019-05-16Far-infrared imaging device and far-infrared imaging method
#11 | 2018-07-26Far-infrared spectroscopy device
#12 | 2018-02-01Terahertz wave generating device and spectroscopic device using same
#13 | 2017-04-13Defect inspection method and its device
#14 | 2016-10-13Far-infrared imaging device and far-infrared imaging method
#15 | 2015-01-22Defect inspection method and its device
#16 | 2014-11-13Inspection apparatus
#17 | 2014-07-31Optical microscope device and testing apparatus comprising same
#18 | 2014-06-12Inspection apparatus
793972 ⎘