Toshiyuki ARITAKE

City:

Mie

Country:

Japan

Published Applications:

Last publication date:

2014-07-17

Top Assignees for applications by Toshiyuki ARITAKE

The entities that hold a legal rights for patent applications filed by inventor ARITAKE Toshiyuki:

Toshiyuki ARITAKE from Mie, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Defect pattern evaluation method, defect pattern evaluation apparatus, and recording media

InventorID:

839472 ⎘