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Inventor profile of:

Yiyan Chen

City:

Naperville, Illinois

Country:

United States

Published Applications:

1

Last publication date:

2014-07-17

Recent patent applications by Chen Yiyan

Yiyan Chen from Naperville, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2014-07-17

US20140201091A1

Quality Control Audit System and Process

InventorID:

841048 ⎘