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Inventor profile of:

Yuta Urano

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2025-07-24

Top Assignees for applications by Yuta Urano

The entities that hold a legal rights for patent applications filed by inventor Urano Yuta:

HITACHI HIGH-TECHNOLOGIES CORPORATION 20 Tokyo, Japan
HITACHI HIGH-TECH CORPORATION 10 Tokyo, Japan
Hitachi High-Technologies Corporation 4 Minato-ku, TOKYO, Japan
The University of Tokyo 1 Tokyo, Japan
HITACHI, LTD. 1 Tokyo, Japan
HITACHI HIGH-TECH SCIENCE CORPORATION 1 Tokyo, Japan
Hitachi High-Technologies Corporaiton 1 Tokyo, Japan

Recent patent applications by Urano Yuta

Yuta Urano from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-07-24

US20250237615A1

Physics

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

#2 | 2025-04-24

US20250133295A1

Electricity

IMAGE PROCESSING SYSTEM

#3 | 2025-04-17

US20250123220A1

Physics

Defect Inspection Apparatus and Defect Inspection Method

#4 | 2024-07-11

US20240230551A9

Physics

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT SUBSTRATE

#5 | 2024-04-25

US20240133824A1

Physics

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT SUBSTRATE

#6 | 2024-03-21

US20240096667A1

Electricity

DEFECT INSPECTION DEVICE

#7 | 2023-11-30

US20230386328A1

Physics

COMMUNICATION DEVICE, COMMUNICATION CONTROL METHOD, AND STORAGE MEDIUM

#8 | 2023-11-23

US20230377310A1

Physics

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, MOVABLE APPARATUS, AND STORAGE MEDIUM

#9 | 2023-06-08

US20230175978A1

Physics

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

#10 | 2023-03-30

US20230100249A1

Physics

INFORMATION PROCESSING DEVICE, CONTROL METHOD, AND NON-TRANSITORY COMPUTER-READABLE MEDIA

#11 | 2022-09-15

US20220291140A1

Physics

Defect inspection device and defect inspection method

#12 | 2022-05-19

US20220155240A1

Physics

Defect detection device, defect detection method, and defect observation apparatus including defect detection device

#13 | 2022-03-10

US20220074868A1

Physics

Defect inspection device and inspection method, and optical module

#14 | 2021-01-28

US20210025829A1

Physics

Defect inspection apparatus and defect inspection method

#15 | 2020-08-13

US20200256804A1

Physics

Defect inspection apparatus and defect inspection method

#16 | 2020-06-11

US20200182804A1

Physics

Defect inspection apparatus and pattern chip

#17 | 2020-01-16

US20200018823A1

Physics

Distance measuring device, distance measuring method, and three-dimensional shape measuring apparatus

#18 | 2019-04-11

US20190107498A1

Physics

Defect inspection device, pattern chip, and defect inspection method

#19 | 2018-07-19

US20180202947A1

Physics

X-ray inspection method and X-ray inspection device

#20 | 2017-09-14

US20170261441A1

Physics

X-ray inspection method and device

#21 | 2017-05-25

US20170146463A1

Physics

Defect inspection device and defect inspection method

#22 | 2017-04-20

US20170108444A1

Physics

Defect observation method and device and defect detection device

#23 | 2017-04-13

US20170102339A1

Physics

Defect inspection device and defect inspection method

#24 | 2016-10-20

US20160305893A1

Physics

Defect inspection method and device using same

#25 | 2016-07-28

US20160216217A1

Physics

Defect inspection device and defect inspection method

#26 | 2016-06-09

US20160161422A1

Physics

Defect inspection method and defect inspection device

#27 | 2016-04-21

US20160109382A1

Physics

Defect inspection method and device for same

#28 | 2016-02-11

US20160041092A1

Physics

Method and apparatus for inspecting defects

#29 | 2016-01-21

US20160018340A1

Physics

Method for reviewing a defect and apparatus

#30 | 2016-01-14

US20160011123A1

Physics

Defect inspection method and device using same

#31 | 2015-10-01

US20150276623A1

Physics

Defect inspection method and defect inspection device

#32 | 2015-08-27

US20150241361A1

Physics

Defect inspection device and defect inspection method

#33 | 2015-05-28

US20150146200A1

Physics

Defect inspection device and defect inspection method

#34 | 2015-04-30

US20150116702A1

Physics

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

#35 | 2015-03-05

US20150062581A1

Physics

Defect inspection apparatus and defect inspection method

#36 | 2014-11-06

US20140328459A1

Physics

X-ray inspection device, inspection method, and X-ray detector

#37 | 2014-09-18

US20140268122A1

Physics

Defect inspection method and defect inspection device

#38 | 2014-09-11

US20140253912A1

Physics

Defect inspection method and device for same

#39 | 2014-07-24

US20140204194A1

Physics

DEFECT OBSERVATION METHOD AND DEVICE THEREFOR

InventorID:

844591 ⎘