Benjamin D. Bunday

City:

Schenectady, New York

Country:

United States

Published Applications:

Last publication date:

2017-02-09

Top Assignees for applications by Benjamin D. Bunday

The entities that hold a legal rights for patent applications filed by inventor Bunday Benjamin D.:

SEMATECH, INC. 1 Albany, NY United States
The Research Foundation for the State University of New York 1 Albany, NY United States

Recent patent applications by Bunday Benjamin D.

Benjamin D. Bunday from Schenectady, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2017-02-09

US20170040228A1

Electricity

METHOD FOR REDUCING CHARGE IN CRITICAL DIMENSION-SCANNING ELECTRON MICROSCOPE METROLOGY

#2 | 2014-07-24

US20140206112A1

Electricity

METHOD FOR REDUCING CHARGE IN CRITICAL DIMENSION-SCANNING ELECTRON MICROSCOPE METROLOGY

InventorID:

846747 ⎘