Eindhoven
Netherlands
42
2026-04-16
The entities that hold a legal rights for patent applications filed by inventor Potocek Pavel:
Pavel Potocek from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
EDGE LOCALIZATION VIA INTELLIGENT INSERTION OF IMAGE PROCESSING CALIPERS
#2 | 2026-04-16TEXT-CONDITIONED ANOMALY DETECTION FOR CHARGED-PARTICLE MICROSCOPY IMAGES
#3 | 2026-02-19MULTIMODAL SIGNAL ACQUISITION SYNCHRONIZED BY UNIVERSAL CLOCK
#4 | 2025-12-11DETECTING AND ADJUSTING LAMELLA DEFORMATION
#5 | 2025-10-16DATA ACQUISITION IN CHARGED PARTICLE MICROSCOPY
#6 | 2025-06-19LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PARTICLE MICROSCOPY
#7 | 2024-04-04Dynamic Data Driven Detector Tuning for Improved Investigation of Samples in Charged Particle Systems
#8 | 2024-03-21Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method
#9 | 2024-03-21Adaptive specimen image acquisition using an artificial neural network
#10 | 2024-02-29Application Management For Charged Particle Microscope Devices
#11 | 2023-12-07Live-assisted image acquisition method and system with charged particle microscopy
#12 | 2023-02-02Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
#13 | 2022-12-29Charged particle microscope scan masking for three-dimensional reconstruction
#14 | 2022-11-24SPARSE IMAGE RECONSTRUCTION FROM NEIGHBORING TOMOGRAPHY TILT IMAGES
#15 | 2022-09-29Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
#16 | 2022-03-31Depth reconstruction for 3D images of samples in a charged particle system
#17 | 2022-03-22Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images
#18 | 2021-10-21Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method
#19 | 2021-05-20Method, device and system for remote deep learning for microscopic image reconstruction and segmentation
#20 | 2021-05-06Adaptive specimen image acquisition
#21 | 2021-04-08Low keV ion beam image restoration by machine learning for object localization
#22 | 2021-02-18Training an artificial neural network using simulated specimen images
#23 | 2020-11-12Acquisition strategy for neural network based image restoration
#24 | 2020-10-01ARTIFICIAL INTELLIGENCE ENABLED VOLUME RECONSTRUCTION
#25 | 2020-04-09OBJECT TRACKING USING IMAGE SEGMENTATION
#26 | 2020-01-30Training an artificial neural network using simulated specimen images
#27 | 2020-01-23Adaptive specimen image acquisition using an artificial neural network
#28 | 2019-11-14Charge reduction by digital image correlation
#29 | 2019-09-19Method, device and system for remote deep learning for microscopic image reconstruction and segmentation
#30 | 2019-02-14Method of analyzing surface modification of a specimen in a charged-particle microscope
#31 | 2018-03-22Tomographic imaging method
#32 | 2017-10-26Three-dimensional imaging in charged-particle microscopy
#33 | 2016-12-15Method of analyzing surface modification of a specimen in a charged-particle microscope
#34 | 2016-04-28Composite scan path in a charged particle microscope
#35 | 2016-04-21Charged particle microscope with special aperture plate
#36 | 2016-01-14Computational scanning microscopy with improved resolution
#37 | 2015-12-24Mathematical image assembly in a scanning-type microscope
#38 | 2015-10-01Imaging a Sample with Multiple Beams and Multiple Detectors
#39 | 2014-10-23Charged-particle microscope providing depth-resolved imagery
#40 | 2014-05-29Method of sampling a sample and displaying obtained information
#41 | 2013-09-05Charged particle microscope providing depth-resolved imagery
#42 | 2013-02-14Charged-particle microscope providing depth-resolved imagery
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