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Inventor profile of:

Michael A. Stuber

City:

Carlsbad, California

Country:

United States

Published Applications:

Last publication date:

2024-11-21

Top Assignees for applications by Michael A. Stuber

The entities that hold a legal rights for patent applications filed by inventor Stuber Michael A.:

IO SEMICONDUCTOR, INC. 22 San Diego, CA United States
pSemi Corporation 15 San Diego, CA United States
PEREGRINE SEMICONDUCTOR CORPORATION 10 San Diego, CA United States
Silanna Semiconductor U.S.A., Inc. 9 San Diego, CA United States
QUALCOMM INCORPORATED 7 San Diego, CA United States
QUALCOMM SWITCH CORP. 1 San Diego, CA United States

Recent patent applications by Stuber Michael A.

Michael A. Stuber from Carlsbad, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-11-21

US20240388285A1

Electricity

METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USING AN ACCUMULATED CHARGE SINK

#2 | 2024-08-08

US20240266441A1

Electricity

METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLING ACCUMULATED CHARGE

#3 | 2022-09-29

US20220311432A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#4 | 2022-06-09

US20220181497A1

Electricity

Method and apparatus improving gate oxide reliability by controlling accumulated charge

#5 | 2021-06-24

US20210194478A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#6 | 2020-10-22

US20200335633A1

Electricity

Method and apparatus improving gate oxide reliability by controlling accumulated charge

#7 | 2020-09-17

US20200295751A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#8 | 2020-04-09

US20200112305A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#9 | 2020-02-27

US20200067504A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#10 | 2020-01-30

US20200036378A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#11 | 2020-01-30

US20200036377A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#12 | 2019-08-01

US20190238126A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#13 | 2019-03-21

US20190089348A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#14 | 2019-03-21

US20190088781A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction

#15 | 2018-03-22

US20180083614A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#16 | 2017-08-17

US20170236946A1

Electricity

Method and apparatus improving gate oxide reliability by controlling accumulated charge

#17 | 2016-09-01

US20160254231A1

Electricity

Methods of making integrated circuit assembly with faraday cage and including a conductive ring

#18 | 2016-06-30

US20160191040A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#19 | 2015-05-21

US20150137307A1

Electricity

Integrated circuit assembly with faraday cage

#20 | 2014-11-06

US20140327077A1

Electricity

Semiconductor-on-insulator integrated circuit with reduced off-state capacitance

#21 | 2014-10-30

US20140319698A1

Electricity

Redistribution layer contacting first wafer through second wafer

#22 | 2014-10-02

US20140291860A1

Electricity

Semiconductor-on-insulator integrated circuit with interconnect below the insulator

#23 | 2014-06-26

US20140175637A1

Electricity

Back-to-back stacked integrated circuit assembly and method of making

#24 | 2014-06-19

US20140167834A1

Electricity

Method and apparatus improving gate oxide reliability by controlling accumulated charge

#25 | 2014-06-10

US13851926

Semiconductor-on-insulator integrated circuit with interconnect below the insulator

#26 | 2014-02-06

US20140035129A1

Electricity

Thin integrated circuit chip-on-board assembly and method of making

#27 | 2014-01-30

US20140030871A1

Electricity

Trap rich layer with through-silicon-vias in semiconductor devices

#28 | 2013-12-26

US20130344680A1

Electricity

Trap rich layer formation techniques for semiconductor devices

#29 | 2013-11-07

US20130293280A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#30 | 2013-10-24

US20130280884A1

Electricity

Methods for the formation of a trap rich layer

#31 | 2013-09-05

US20130228855A1

Electricity

Vertical semiconductor device with thinned substrate

#32 | 2013-08-29

US20130221433A1

Electricity

Double-sided vertical semiconductor device with thinned substrate

#33 | 2013-06-13

US20130147061A1

Electricity

Trap rich layer with through-silicon-vias in semiconductor devices

#34 | 2013-05-30

US20130134585A1

Electricity

Integrated circuit assembly and method of making

#35 | 2013-05-23

US20130130479A1

Electricity

Semiconductor-on-insulator with back side body connection

#36 | 2013-04-04

US20130084689A1

Electricity

Trap rich layer formation techniques for semiconductor devices

#37 | 2013-02-14

US20130037922A1

Electricity

Trap rich layer with through-silicon-vias in semiconductor devices

#38 | 2012-08-23

US20120211835A1

Electricity

Semiconductor-on-insulator with back side connection

#39 | 2012-08-16

US20120205725A1

Electricity

Semiconductor-on-insulator with back side strain inducing material

#40 | 2012-07-05

US20120169398A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#41 | 2012-06-28

US20120161310A1

Electricity

Trap rich layer for semiconductor devices

#42 | 2012-06-14

US20120146193A1

Electricity

Thermal conduction paths for semiconductor structures

#43 | 2012-04-12

US20120088339A1

Electricity

Vertical semiconductor device with thinned substrate

#44 | 2012-04-12

US20120086045A1

Electricity

Vertical semiconductor device with thinned substrate

#45 | 2011-09-22

US20110227637A1

Electricity

Method and apparatus improving gate oxide reliability by controlling accumulated charge

#46 | 2011-07-14

US20110169550A1

Electricity

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

#47 | 2011-01-20

US20110012669A1

Electricity

Semiconductor-on-insulator with back side connection

#48 | 2011-01-20

US20110012223A1

Electricity

Semiconductor-on-insulator with back side support layer

#49 | 2011-01-20

US20110012199A1

Electricity

Semiconductor-on-insulator with back side heat dissipation

#50 | 2008-09-25

US20080230837A1

Electricity

Radiation-hardened silicon-on-insulator CMOS device, and method of making the same

#51 | 2007-03-29

US20070069291A1

Electricity

Method and apparatus improving gate oxide reliability by controlling accumulated charge

#52 | 2007-01-25

US20070018247A1

Electricity

Method and apparatus for use in improving linearity of MOSFET's using an accumulated charge sink

#53 | 2005-01-13

US20050006703A1

Electricity

Radiation-hardened silicon-on-insulator CMOS device, and method of making the same

InventorID:

85296 ⎘