Fen Chen

Moisture detection and ingression monitoring systems and methods of manufacture

Moisture detection and ingression monitoring systems and methods of manufacture

Moisture detection and ingression monitoring systems and methods of manufacture

Moisture detection and ingression monitoring systems and methods of manufacture

Moisture detection and ingression monitoring systems and methods of manufacture

Electromigration monitor

Electromigration monitor

Semiconductor chip with anti-reverse engineering function

Semiconductor chip with anti-reverse engineering function

Semiconductor chip with anti-reverse engineering function

Thru-silicon-via structures

Moisture detection and ingression monitoring systems and methods of manufacture

Via leakage and breakdown testing

Electromigration testing of interconnect analogues having bottom-connected sensory pins

DEVICE STRUCTURE WITH NEGATIVE RESISTANCE CHARACTERISTICS

NON-CONTIGUOUS DUMMY STRUCTURE SURROUNDING THROUGH-SUBSTRATE VIA NEAR INTEGRATED CIRCUIT WIRES

Wiring structures

Copper wire and dielectric with air gaps

Electromigration monitor

TSV WITH END CAP, METHOD AND 3D INTEGRATED CIRCUIT

ALTERNATING OPEN-ENDED VIA CHAINS FOR TESTING VIA FORMATION AND DIELECTRIC INTEGRITY

Non-planar field effect transistor test structure and lateral dielectric breakdown testing method

Semiconductor chip with a dual damascene wire and through-substrate via (TSV) structure

Copper wire and dielectric with air gaps

Copper wire and dielectric with air gaps

Structures and methods for monitoring dielectric reliability with through-silicon vias

Integrated circuit structure with through-semiconductor via

Integrated circuit structure with metal cap and methods of fabrication

Alternating open-ended via chains for testing via formation and dielectric integrity

Semiconductor structure incorporating a contact sidewall spacer with a self-aligned airgap and a method of forming the semiconductor structure

Semiconductor structure with thin film resistor and terminal bond pad

Testing structure and method of using the testing structure

Method of changing reflectance or resistance of a region in an optoelectronic memory device

On-chip poly-to-contact process monitoring and reliability evaluation system and method of use

3D via capacitor with a floating conductive plate for improved reliability

3D via capacitor with a floating conductive plate for improved reliability

Structure including voltage controlled negative resistance

Real-time on-chip EM performance monitoring

Analyzing EM performance during IC manufacturing

Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migration

Wiring structure and method of forming the structure

OPTOELECTRONIC MEMORY DEVICES

Stackable programmable passive device and a testing method

Method for managing circuit reliability

3D via capacitor with a floating conductive plate for improved reliability

Semiconductor structures and methods of manufacture

On-chip embedded thermal antenna for chip cooling

Optoelectronic memory devices

On-chip embedded thermal antenna for chip cooling

Method of forming metal ion transistor

Method for forming thin film resistor and terminal bond pad simultaneously

Thermally programmable anti-reverse engineering interconnects wherein interconnects only conduct when heated above room temperature

Device structures with a self-aligned damage layer and methods for forming such device structures

Method of making thermally programmable anti-reverse engineering interconnects wherein interconnects only conduct when heated above room temperature

Metal ion transistor

Design structure for an on-chip real-time moisture sensor for and method of detecting moisture ingress in an integrated circuit chip

Non-Destructive Electrical Characterization Macro and Methodology for In-Line Interconnect Spacing Monitoring

Phase-change TaN resistor based triple-state/multi-state read only memory

Phase-change TaN resistor based triple-state/multi-state read only memory

On-Chip Real-Time Moisture Sensor For and Method of Detecting Moisture Ingress in an Integrated Circuit Chip

PROGRAMMABLE RESISTOR, SWITCH OR VERTICAL MEMORY CELL

Method and apparatus for impedance matching in transmission circuits using tantalum nitride resistor devices

Method and apparatus for impedance matching in transmission circuits using tantalum nitride resistor devices

Non-destructive evaluation of microstructure and interface roughness of electrically conducting lines in semiconductor integrated circuits in deep sub-micron regime

Stackable programmable passive device and a testing method

Optoelectronic memory devices

Phase-change TaN resistor based triple-state/multi-state read only memory

Trench type buried on-chip precision programmable resistor

Thermo-mechanical cleavable structure

Determination of grain sizes of electrically conductive lines in semiconductor integrated circuits

Trench type buried on-chip precision programmable resistor