Oberkochen
Germany
45
2026-04-23
The entities that hold a legal rights for patent applications filed by inventor Schubert Stefan:
Stefan Schubert from Oberkochen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
MULTI-BEAM CHARGED PARTICLE MICROSCOPE FOR INSPECTION WITH IMPROVED IMAGE CONTRAST
#2 | 2026-04-02MULTIPLE PARTICLE BEAM SYSTEM, IN PARTICULAR MULTI-BEAM PARTICLE MICROSCOPE, HAVING A FAST MAGNETIC LENS AND THE USE THEREOF
#3 | 2026-03-19MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST AUTOFOCUS AROUND AN ADJUSTABLE WORKING DISTANCE
#4 | 2025-12-11PARTICLE BEAM SYSTEM
#5 | 2025-11-13MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH A DETECTION UNIT FOR FAST COMPENSATION OF CHARGING EFFECTS
#6 | 2025-08-21MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM WITH REDUCED CHARGING EFFECTS
#7 | 2025-07-24MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ANISOTROPIC FILTERING FOR IMPROVED IMAGE CONTRAST
#8 | 2025-07-17PARTICLE BEAM SYSTEM
#9 | 2025-06-26METHOD FOR VOLTAGE CONTRAST IMAGING WITH A CORPUSCULAR MULTI-BEAM MICROSCOPE, CORPUSCULAR MULTI-BEAM MICROSCOPE FOR VOLTAGE CONTRAST IMAGING AND SEMICONDUCTOR STRUCTURES FOR VOLTAGE CONTRAST IMAGING WITH A CORPUSCULAR MULTI-BEAM MICROSCOPE
#10 | 2025-03-27MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM WITH IMPROVED IMAGING OF SECONDARY ELECTRON BEAMLETS ON A DETECTOR
#11 | 2025-03-27METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE, COMPUTER PROGRAM PRODUCT AND MULTI-BEAM PARTICLE MICROSCOPE
#12 | 2024-11-07MULTIPLE CHARGED PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION, METHOD FOR OPERATING A MULTI-BEAM CHARGED PARTICLE MICROSCOPE SYSTEM WITH A MIRROR MODE OF OPERATION AND ASSOCIATED COMPUTER PROGRAM PRODUCT
#13 | 2024-07-04METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE IN A CONTRAST OPERATING MODE WITH DEFOCUSED BEAM GUIDING, COMPUTER PROGRAM PRODUCT AND MULTI-BEAM PARTICLE MICROSCOPE
#14 | 2024-03-14MULTI-BEAM MICROSCOPE AND METHOD FOR OPERATING A MULTI-BEAM MICROSCOPE USING SETTINGS ADJUSTED TO AN INSPECTION SITE
#15 | 2023-08-03MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST AUTOFOCUS AROUND AN ADJUSTABLE WORKING DISTANCE
#16 | 2023-06-29MULTIPLE PARTICLE BEAM SYSTEM WITH A CONTRAST CORRECTION LENS SYSTEM
#17 | 2023-06-01MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION, METHOD FOR OPERATING A MULTIPLE PARTICLE BEAM SYSTEM WITH A MIRROR MODE OF OPERATION AND ASSOCIATED COMPUTER PROGRAM PRODUCT
#18 | 2022-11-03MULTI-BEAM DIGITAL SCAN AND IMAGE ACQUISITION
#19 | 2022-09-01PARTICLE BEAM SYSTEM INCLUDING A MULTI-BEAM DEFLECTION DEVICE AND A BEAM STOP, METHOD FOR OPERATING THE PARTICLE BEAM SYSTEM AND ASSOCIATED COMPUTER PROGRAM PRODUCT
#20 | 2022-08-11METHOD FOR VOLTAGE CONTRAST IMAGING WITH A CORPUSCULAR MULTI-BEAM MICROSCOPE, CORPUSCULAR MULTI-BEAM MICROSCOPE FOR VOLTAGE CONTRAST IMAGING AND SEMICONDUCTOR STRUCTURES FOR VOLTAGE CONTRAST IMAGING WITH A CORPUSCULAR MULTI-BEAM MICROSCOPE
#21 | 2022-05-05Particle beam system and the use thereof for flexibly setting the current intensity of individual particle beams
#22 | 2022-04-07Charged particle beam system
#23 | 2021-10-07Particle beam system and method for the particle-optical examination of an object
#24 | 2021-07-15Multi-beam particle beam system and method for operating same
#25 | 2021-06-24Method for detector equalization during the imaging of objects with a multi-beam particle microscope
#26 | 2021-05-13Particle beam system
#27 | 2020-12-31Charged particle beam system
#28 | 2020-11-26Multi-beam particle microscope
#29 | 2020-07-30Objective lens arrangement usable in particle-optical systems
#30 | 2020-03-26Particle beam system and method for the particle-optical examination of an object
#31 | 2019-11-21Charged particle beam system
#32 | 2019-04-25Particle beam system and method for the particle-optical examination of an object
#33 | 2019-02-28Charged particle beam system and method of operating the same
#34 | 2017-11-02Particle beam system and method for the particle-optical examination of an object
#35 | 2017-10-12Objective lens arrangement usable in particle-optical systems
#36 | 2016-08-25Charged particle beam system and method of operating the same
#37 | 2016-08-18Charged particle inspection method and charged particle system
#38 | 2016-06-23OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS
#39 | 2015-10-08Focusing a charged particle system
#40 | 2015-04-02Charged particle multi-beam inspection system and method of operating the same
#41 | 2015-01-08Charged particle inspection method and charged particle system
#42 | 2014-10-16Scanning particle microscope having an energy selective detector system
#43 | 2014-08-14Focusing a charged particle imaging system
#44 | 2009-10-15Charged Particle Inspection Method and Charged Particle System
#45 | 2009-06-25Particle-Optical Component
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