Boulder, Colorado
United States
5
2021-03-18
The entities that hold a legal rights for patent applications filed by inventor Raschke Markus B.:
Markus B. Raschke from Boulder, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Methods and systems for scanning probe sample property measurement and imaging
#2 | 2016-02-04Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light Source
#3 | 2015-03-05Method and apparatus of physical property measurement using a probe-based nano-localized light source
#4 | 2014-09-11Method and apparatus of physical property measurement using a probe-based nano-localized light source
#5 | 2014-07-29Method and apparatus for infrared scattering scanning near-field optical microscopy
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