Inventor profile of:

Joerg Steinert

City:

Jena

Country:

Germany

Published Applications:

30

Last publication date:

2026-01-29

Top Assignees for applications by Joerg Steinert

The entities that hold a legal rights for patent applications filed by inventor Steinert Joerg:

Recent patent applications by Steinert Joerg

Joerg Steinert from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-01-29
US20260029631A1
Physics

Apparatus and Method for Light Field Microscopy

#2 | 2025-01-02
US20250008234A1
Electricity

METHOD FOR CORRECTING MEASUREMENT VALUES OF AN OPTICAL DETECTION CHANNEL

#3 | 2024-05-23
US20240168272A1
Physics

Method and device for microscopy

#4 | 2024-02-15
US20240053594A1
Physics

Method and Device for Microscopy

#5 | 2016-07-21
US20160209588A1
Physics

Optoelectronic detector, in particular for high-resolution light scanning microscopy

#6 | 2014-10-02
US20140293410A1
Physics

LASER SCANNING MICROSCOPE

#7 | 2010-12-23
US20100321752A1
Physics

Method for correcting a control of an optical scanner and the optical scanner

#8 | 2010-07-29
US20100188741A1
Physics

Laser scanning microscope

#9 | 2009-09-24
US20090236522A1
Physics

Optical zoom system for a light scanning microscope

#10 | 2009-09-10
US20090224174A1
Physics

Calibration device and laser scanning microscope with such a calibration device

#11 | 2009-01-08
US20090008539A1
Physics

Method for correcting a control of an optical scanner in a device for imaging a sample by scanning and the device for performing the method

#12 | 2008-01-31
US20080024782A1
Physics

Laser scanning microscope

#13 | 2007-11-01
US20070253046A1
Physics

Correction device for an optical arrangement and confocal microscope with such a device

#14 | 2007-11-01
US20070253044A1
Physics

Correction device for an optical arrangement and confocal microscope with such a device

#15 | 2007-10-18
US20070242268A1
Physics

Spectral analysis unit with a diffraction grating

#16 | 2007-06-28
US20070146472A1
Physics

Method for scanner control in at least one scan axis in a laser scanning microscope

#17 | 2007-06-14
US20070131875A1
Physics

Process for the observation of at least one sample region with a light raster microscope

#18 | 2007-04-19
US20070086048A1
Physics

Method for correcting a control of an optical scanner and the optical scanner

#19 | 2007-04-05
US20070076293A1
Physics

Optical zoom system for a light scanning electron microscope

#20 | 2006-12-07
US20060273261A1
Physics

Laser scanning microscope

#21 | 2006-03-09
US20060049343A1
Physics

Optical zoom system for a light scanning electron microscope

#22 | 2006-01-19
US20060012892A1
Physics

Correction device for an optical arrangement and confocal microscope with such a device

#23 | 2006-01-19
US20060012871A1
Physics

Light scanning microscope and use

#24 | 2006-01-19
US20060012870A1
Physics

Light scanning microscope with line-by-line scanning and use

#25 | 2006-01-19
US20060012862A1
Physics

Light scanning microscope point-shaped light source distribution and use

#26 | 2006-01-19
US20060012785A1
Physics

Light scanning electron microscope and use

#27 | 2006-01-19
US20060011858A1
Physics

Process for the observation of at least one sample region with a light raster microscope

#28 | 2006-01-19
US20060011832A1
Physics

Optical zoom system for a light scanning electron microscope

#29 | 2006-01-19
US20060011824A1
Physics

Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point

#30 | 2006-01-19
US20060011804A1
Physics

Process for the observation of at least one sample region with a light raster microscope with linear sampling

InventorID:

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