Inventor profile of:

Stefan Wilhelm

City:

Jena

Country:

Germany

Published Applications:

30

Last publication date:

2025-12-11

Top Assignees for applications by Stefan Wilhelm

The entities that hold a legal rights for patent applications filed by inventor Wilhelm Stefan:

Recent patent applications by Wilhelm Stefan

Stefan Wilhelm from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-12-11
US20250377529A1
Physics

Microscope and method of microscopy for examining a sample

#2 | 2024-09-12
US20240305061A1
Electricity

DEVICE AND METHOD FOR CONTROLLING A LIGHT SOURCE IN A MICROSCOPE

#3 | 2022-03-03
US20220066111A1
Physics

Optical fiber plug connection and adjustment method

#4 | 2018-08-16
US20180231416A1
Physics

Method and apparatus for actuating an acousto-optical component

#5 | 2017-08-10
US20170227748A1
Physics

Device and method for multispot scanning microscopy

#6 | 2015-01-15
US20150015929A1
Physics

Optical switch and beam stabilization device

#7 | 2014-10-02
US20140293410A1
Physics

LASER SCANNING MICROSCOPE

#8 | 2012-09-13
US20120229879A1
Physics

MIRROR CASCADE FOR BUNDLING A PLURALITY OF LIGHT SOURCES AND A LASER-SCANNING MICROSCOPE

#9 | 2011-04-28
US20110096386A1
Physics

Laser scanning microscope having a laser diode comprising a light modulation device

#10 | 2011-03-03
US20110051234A1
Electricity

Laser scanning microscope having variable light intensity and control method for the same

#11 | 2010-10-07
US20100254000A1
Physics

MIRROR CASCADE FOR BUNDLING A PLURALITY OF LIGHT SOURCES AND A LASER-SCANNING MICROSCOPE

#12 | 2010-07-29
US20100188741A1
Physics

Laser scanning microscope

#13 | 2010-02-04
US20100027108A1
Physics

Confocal laser microscope

#14 | 2009-02-19
US20090046360A1
Physics

Raster scanning light microscope with line pattern scanning and applications

#15 | 2008-11-20
US20080285123A1
Physics

Raster scanning light microscope

#16 | 2008-02-21
US20080043786A1
Physics

Tunable light source for use in microscopy

#17 | 2007-06-14
US20070133086A1
Physics

Method and apparatus for the examination of specimens

#18 | 2007-06-14
US20070131875A1
Physics

Process for the observation of at least one sample region with a light raster microscope

#19 | 2006-11-16
US20060255237A1
Physics

Arrangement for the detection of illumination radiation in a laser scanning microscope

#20 | 2006-01-19
US20060012874A1
Physics

Raster scanning light microscope with punctiform light source distribution and applications

#21 | 2006-01-19
US20060012864A1
Physics

Raster scanning light microscope with line pattern scanning and applications

#22 | 2006-01-19
US20060011858A1
Physics

Process for the observation of at least one sample region with a light raster microscope

#23 | 2006-01-19
US20060011857A1
Physics

Raster scanning light microscope with line pattern scanning and applications

#24 | 2006-01-19
US20060011824A1
Physics

Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point

#25 | 2006-01-19
US20060011804A1
Physics

Process for the observation of at least one sample region with a light raster microscope with linear sampling

#26 | 2005-04-07
US20050072913A1
Physics

Laser scanning microscope

#27 | 2005-03-24
US20050063051A1
Physics

Arrangement for the direct inout coupling of a laser, particularly of a short-pulse laser

#28 | 2005-03-03
US20050046932A1
Physics

Arrangement in the illumination beam path of a laser scanning microscope

#29 | 2005-02-17
US20050035281A1
Physics

Arrangement for the detection of illumination radiation in a laser scanning microscope

#30 | 2005-02-01
US9238859
-

Laser scanning microscope with AOTF

InventorID:

919239 ⎘