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Inventor profile of:

Daisuke Bizen

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2026-02-26

Top Assignees for applications by Daisuke Bizen

The entities that hold a legal rights for patent applications filed by inventor Bizen Daisuke:

HITACHI HIGH-TECH CORPORATION 16 Tokyo, Japan
HITACHI, LTD. 4 Tokyo, Japan
HITACHI HIGH-TECHNOLOGIES CORPORATION 4 Tokyo, Japan
Hitachi, Ltd. 1 Chiyoda-ku, Tokyo, Japan

Recent patent applications by Bizen Daisuke

Daisuke Bizen from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-02-26

US20260058088A1

Electricity

CHARGED PARTICLE BEAM DEVICE AND CONTROL METHOD THEREOF

#2 | 2025-10-23

US20250327663A1

Physics

Pattern Measurement Method, Measurement System, and Computer-Readable Medium

#3 | 2025-07-17

US20250232944A1

Electricity

MULTIPOLE LENS AND CHARGED PARTICLE BEAM DEVICE

#4 | 2024-10-31

US20240363306A1

Electricity

CHARGED PARTICLE BEAM DEVICE

#5 | 2024-07-04

US20240222065A1

Electricity

SAMPLE IMAGE OBSERVATION DEVICE AND METHOD

#6 | 2024-01-25

US20240029994A1

Electricity

Inspection System

#7 | 2023-08-31

US20230273254A1

Physics

Inspection method

#8 | 2023-08-10

US20230253180A1

Electricity

CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD

#9 | 2023-03-30

US20230095456A1

Electricity

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CALCULATING ROUGHNESS INDEX

#10 | 2022-08-04

US20220246394A1

Electricity

Charged particle beam system and method for determining observation conditions in charged particle beam device

#11 | 2022-07-07

US20220216032A1

Electricity

CHARGED PARTICLE BEAM DEVICE

#12 | 2022-05-05

US20220139667A1

Electricity

Charged particle beam device

#13 | 2022-04-14

US20220115203A1

Electricity

Charged particle beam apparatus and control method

#14 | 2021-12-30

US20210404801A1

Physics

Pattern Measurement Method, Measurement System, and Computer-Readable Medium

#15 | 2021-10-07

US20210313140A1

Electricity

Charged particle beam device

#16 | 2021-08-12

US20210249221A1

Electricity

Charged particle beam apparatus

#17 | 2020-10-08

US20200321189A1

Electricity

Pattern cross-sectional shape estimation system and program

#18 | 2020-07-23

US20200234916A1

Electricity

Scanning electron microscope and calculation method for three-dimensional structure depth

#19 | 2020-06-11

US20200185189A1

Electricity

Charged-particle beam apparatus

#20 | 2019-11-14

US20190348255A1

Electricity

Scanning electron microscope and sample observation method using scanning electron microscope

#21 | 2019-09-26

US20190295805A1

Electricity

Electron beam device

#22 | 2018-10-04

US20180286629A1

Electricity

Charged particle beam apparatus

#23 | 2018-03-08

US20180067294A1

Physics

Scanning microscope with controlled variable measurement parameters

#24 | 2017-09-14

US20170263415A1

Electricity

Scanning electron microscope and electron trajectory adjustment method therefor

#25 | 2017-07-27

US20170213695A1

Electricity

Charged particle beam device, simulation method, and simulation device

#26 | 2017-06-29

US20170186583A1

Electricity

Scanning electron microscope and method for controlling same

#27 | 2015-02-12

US20150041648A1

Physics

Pattern critical dimension measurement equipment and method for measuring pattern critical dimension

#28 | 2014-10-09

US20140299767A1

Electricity

Charged particle beam device and measuring method using the same

InventorID:

926973 ⎘