Naples, Florida
United States
7
2015-06-11
The entities that hold a legal rights for patent applications filed by inventor Ausschnitt Christopher P.:
Christopher P. Ausschnitt from Naples, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Fabrication of lithographic image fields using a proximity stitch metrology
#2 | 2015-03-26Differential dose and focus monitor
#3 | 2015-02-19Metrology marks for bidirectional grating superposition patterning processes
#4 | 2015-02-19Metrology marks for unidirectional grating superposition patterning processes
#5 | 2014-03-06Discrete sampling based nonlinear control system
#6 | 2013-02-21Self-calibrated alignment and overlay target and measurement
#7 | 2013-02-14Alignment data based process control system
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