Goleta, California
United States
8
2019-10-24
The entities that hold a legal rights for patent applications filed by inventor Labuda Aleksander:
Aleksander Labuda from Goleta, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Metrological scanning probe microscope
#2 | 2018-10-11AM/FM measurements using multiple frequency atomic force microscopy
#3 | 2018-05-10Metrological scanning probe microscope
#4 | 2017-05-11AM/FM measurements using multiple frequency of atomic force microscopy
#5 | 2016-10-27Optical beam positioning unit for atomic force microscope
#6 | 2016-06-16Metrological scanning probe microscope
#7 | 2015-10-29AM/FM measurements using multiple frequency of atomic force microscopy
#8 | 2014-10-23Optical beam positioning unit for atomic force microscope
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