Chie Shishido

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2017-10-19

Top Assignees for applications by Chie Shishido

The entities that hold a legal rights for patent applications filed by inventor Shishido Chie:

Chie Shishido from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Scanning electron microscope

Scanning electron microscope system, pattern measurement method using same, and scanning electron microscope

Charged Particle Microscope System and Measurement Method Using Same

Pattern inspection device and pattern inspection method

Pattern evaluation method and pattern evaluation device

InventorID:

951205 ⎘