Coogee
Australia
20
2019-06-13
The entities that hold a legal rights for patent applications filed by inventor Trupke Thorsten:
Thorsten Trupke from Coogee, AU has applied for patents for these inventions. The list has both pending applications and granted patents:
Methods for inspecting semiconductor wafers
#2 | 2018-05-17Methods for inspecting semiconductor wafers
#3 | 2017-02-02Method and system for testing indirect bandgap semiconductor devices using luminescence imaging
#4 | 2016-04-28Method and system for inspecting indirect bandgap semiconductor structure
#5 | 2016-03-24SEPARATION OF DOPING DENSITY AND MINORITY CARRIER LIFETIME IN PHOTOLUMINESCENCE MEASUREMENTS ON SEMICONDUCTOR MATERIALS
#6 | 2015-11-12Wafer imaging and processing method and apparatus
#7 | 2015-08-06IN-LINE PHOTOLUMINESCENCE IMAGING OF SEMICONDUCTOR DEVICES
#8 | 2015-06-18Methods for inspecting semiconductor wafers
#9 | 2014-08-14Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials
#10 | 2014-07-10Method and system for testing indirect bandgap semiconductor devices using luminescence imaging
#11 | 2013-03-14Illumination Systems and Methods for Photoluminescence Imaging of Photovoltaic Cells and Wafers
#12 | 2013-02-21In-line photoluminescence imaging of semiconductor devices
#13 | 2012-10-11Method and system for inspecting indirect bandgap semiconductor structure
#14 | 2012-07-19Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials
#15 | 2012-06-07PHOTOLUMINESCENCE IMAGING SYSTEMS FOR SILICON PHOTOVOLTAIC CELL MANUFACTURING
#16 | 2012-02-09Method and system for inspecting indirect bandgap semiconductor stucture
#17 | 2011-08-04Photovoltaic cell manufacturing
#18 | 2011-02-03Wafer imaging and processing method and apparatus
#19 | 2010-02-04Determining diffusion length of minority carriers using luminescence
#20 | 2009-02-26Method and system for inspecting indirect bandgap semiconductor structure
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