Wayland, Massachusetts
United States
10
2013-02-21
The entities that hold a legal rights for patent applications filed by inventor Michael David:
David Michael from Wayland, US has applied for patents for these inventions. The list has both pending applications and granted patents:
System and method for aligning a wafer for fabrication
#2 | 2011-12-29Automatically determining machine vision tool parameters
#3 | 2011-03-10Image preprocessing for probe mark inspection
#4 | 2010-12-02Methods and apparatus for practical 3D vision system
#5 | 2009-06-04Method of pattern location using color image data
#6 | 2008-06-19Method and apparatus for automatic measurement of pad geometry and inspection thereof
#7 | 2007-07-10Image preprocessing for probe mark inspection
#8 | 2007-04-12Methods and apparatus for practical 3D vision system
#9 | 2007-01-30Method and apparatus for automatic measurement of pad geometry and inspection thereof
#10 | 2005-11-29Method for obtaining high-resolution performance from a single-chip color image sensor
98496 ⎘