Inventor profile of:

Hyun Mo CHO

City:

Daejeon

Country:

South Korea

Published Applications:

19

Last publication date:

2024-10-10

Top Assignees for applications by Hyun Mo CHO

The entities that hold a legal rights for patent applications filed by inventor CHO Hyun Mo:

Recent patent applications by CHO Hyun Mo

Hyun Mo CHO from Daejeon, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-10-10
US20240337591A1
Physics

SPLIT PRISM SILICON-BASED LIQUID IMMERSION MICROCHANNEL MEASURING DEVICE AND METHOD

#2 | 2023-06-01
US20230168185A1
Physics

Device and method for multi-reflection solution immersed silicon-based microchannel measurement

#3 | 2021-06-17
US20210181090A1
Physics

Normal incidence ellipsometer and method for measuring optical properties of sample by using same

#4 | 2021-03-11
US20210072149A1
Physics

High-sensitive biosensor chip using high extinction coefficient marker and dielectric substrate, measurement system, and measurement method

#5 | 2019-11-14
US20190346363A1
Physics

Liquid immersion micro-channel measurement device and measurement method which are based on trapezoidal incident structure prism incident-type silicon

#6 | 2018-04-26
US20180113069A1
Physics

Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the same

#7 | 2018-04-12
US20180100795A1
Physics

Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement method

#8 | 2016-06-16
US20160169742A1
Physics

Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the same

#9 | 2016-06-02
US20160153894A1
Physics

Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the same

#10 | 2015-09-10
US20150253243A1
Physics

Apparatus and method for simultaneously measuring characteristics of molecular junctions and refractive index of buffer solution

#11 | 2014-10-23
US20140313511A1
Physics

ROTATING-ELEMENT ELLIPSOMETER AND METHOD FOR MEASURING PROPERTIES OF THE SAMPLE USING THE SAME

#12 | 2013-02-21
US20130044318A1
Physics

Rotating-element ellipsometer and method for measuring properties of the sample using the same

#13 | 2012-11-22
US20120295357A1
Physics

Apparatus and method for quantifying binding and dissociation kinetics of molecular interactions

#14 | 2012-03-08
US20120057146A1
Physics

Surface plasmon resonance sensor using vertical illuminating focused-beam ellipsometer

#15 | 2011-09-08
US20110216320A1
Physics

Multi-channel surface plasmon resonance sensor using beam profile ellipsometry

#16 | 2011-03-31
US20110077883A1
Physics

Measurement of Fourier coefficients using integrating photometric detector

#17 | 2010-12-23
US20100321693A1
Physics

Minute measuring instrument for high speed and large area and method thereof

#18 | 2010-11-25
US20100296092A1
Physics

Single polarizer focused-beam ellipsometer

#19 | 2010-02-25
US20100045985A1
Physics

Focused-beam ellipsometer

InventorID:

98705 ⎘