Tokyo
Japan
9
2024-08-08
The entities that hold a legal rights for patent applications filed by inventor Kikuchi Hideki:
Hideki Kikuchi from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Sample Holder and Analysis System
#2 | 2024-06-06Transmission Electron Microscope
#3 | 2021-03-04Electron microscope
#4 | 2020-11-12CHARGED PARTICLE BEAM DEVICE
#5 | 2018-09-20Charged particle beam device
#6 | 2018-03-15Charged particle beam device for moving an aperture having plurality of openings and sample observation method
#7 | 2015-08-27Electron Microscope and Sample Movement Device
#8 | 2015-02-12SOUNDPROOF COVER FOR CHARGED-PARTICLE BEAM DEVICE, AND CHARGED-PARTICLE BEAM DEVICE
#9 | 2014-12-04Charged particle beam microscope, sample holder for charged particle beam microscope, and charged particle beam microscopy
988176 ⎘