Newark, California
United States
6
2015-06-25
The entities that hold a legal rights for patent applications filed by inventor Feld David:
David Feld from Newark, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Distribution of refractive index measurement by synthetic aperture tomography
#2 | 2014-12-11System and method for Hilbert phase imaging
#3 | 2012-12-06Single shot full-field reflection phase microscopy
#4 | 2012-11-29PORTABLE OPTICAL FIBER PROBE-BASED SPECTROSCOPIC SCANNER FOR RAPID CANCER DIAGNOSIS
#5 | 2012-10-11Tri modal spectroscopic imaging
#6 | 2012-02-09Portable raman diagnostic system
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