Concord, California
United States
45
2024-12-31
44
2024-12-31
These are the the leading inventors for applications assigned to SIGRAY, INC.:
SIGRAY, INC. based in Concord, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Secondary image removal using high resolution x-ray transmission sources
#2 | 2024-08-22 ✅ Patent 12,209,977 granted on 2025-01-28X-ray detector system with at least two stacked flat Bragg diffractors
#3 | 2023-11-30 ✅ Patent 12,153,001 granted on 2024-11-26High throughput 3D x-ray imaging system using a transmission x-ray source
#4 | 2023-11-02 ✅ Patent 11,885,755 granted on 2024-01-30X-ray sequential array wavelength dispersive spectrometer
#5 | 2023-09-21 ✅ Patent 11,992,350 granted on 2024-05-28System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
#6 | 2022-06-09 ✅ Patent 11,686,692 granted on 2023-06-27High throughput 3D x-ray imaging system using a transmission x-ray source
#7 | 2022-03-17 ✅ Patent 11,428,651 granted on 2022-08-30System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
#8 | 2022-03-17 ✅ Patent 11,549,895 granted on 2023-01-10System and method using x-rays for depth-resolving metrology and analysis
#9 | 2021-11-18 ✅ Patent 11,215,572 granted on 2022-01-04System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
#10 | 2021-11-16 ✅ Patent 11,175,243 granted on 2021-11-16X-ray dark-field in-line inspection for semiconductor samples
#11 | 2021-08-12 ✅ Patent 11,217,357 granted on 2022-01-04X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
#12 | 2021-03-18 ✅ Patent 11,143,605 granted on 2021-10-12System and method for computed laminography x-ray fluorescence imaging
#13 | 2021-01-21 ✅ Patent 11,152,183 granted on 2021-10-19X-ray source with rotating anode at atmospheric pressure
#14 | 2020-11-05 ✅ Patent 10,991,538 granted on 2021-04-27High brightness x-ray reflection source
#15 | 2020-03-26 ✅ Patent 11,056,308 granted on 2021-07-06System and method for depth-selectable x-ray analysis
#16 | 2020-03-05 ✅ Patent 10,962,491 granted on 2021-03-30System and method for x-ray fluorescence with filtering
#17 | 2020-02-06 ✅ Patent 10,656,105 granted on 2020-05-19Talbot-lau x-ray source and interferometric system
#18 | 2020-01-30 ✅ Patent 10,658,145 granted on 2020-05-19High brightness x-ray reflection source
#19 | 2019-12-05 ✅ Patent 10,845,491 granted on 2020-11-24Energy-resolving x-ray detection system
#20 | 2019-12-05 ✅ Patent 10,989,822 granted on 2021-04-27Wavelength dispersive x-ray spectrometer
#21 | 2019-10-03 ✅ Patent 10,578,566 granted on 2020-03-03X-ray emission spectrometer system
#22 | 2019-08-22 ✅ Patent 10,653,376 granted on 2020-05-19X-ray imaging system
#23 | 2019-08-15 ✅ Patent 10,466,185 granted on 2019-11-05X-ray interrogation system using multiple x-ray beams
#24 | 2019-05-16 ✅ Patent 10,976,273 granted on 2021-04-13X-ray spectrometer system
#25 | 2019-03-21 ✅ Patent 10,297,359 granted on 2019-05-21X-ray illumination system with multiple target microstructures
#26 | 2019-01-10 ✅ Patent 10,416,099 granted on 2019-09-17Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
#27 | 2018-09-13 ✅ Patent 10,304,580 granted on 2019-05-28Talbot X-ray microscope
#28 | 2018-07-19 ✅ Patent 10,247,683 granted on 2019-04-02Material measurement techniques using multiple X-ray micro-beams
#29 | 2018-05-24 ✅ Patent 10,297,359 granted on 2019-05-21X-ray illumination system with multiple target microstructures
#30 | 2017-11-23 ✅ Patent 10,295,485 granted on 2019-05-21X-ray transmission spectrometer system
#31 | 2017-09-14 ✅ Patent 10,352,880 granted on 2019-07-16Method and apparatus for x-ray microscopy
#32 | 2017-02-23 ✅ Patent 10,295,486 granted on 2019-05-21Detector for X-rays with high spatial and high spectral resolution
#33 | 2017-02-16 ✅ Patent 9,570,265 granted on 2017-02-14X-ray fluorescence system with high flux and high flux density
#34 | 2016-12-01 ✅ Patent 10,269,528 granted on 2019-04-23Diverging X-ray sources using linear accumulation
#35 | 2016-11-03 ✅ Patent 10,401,309 granted on 2019-09-03X-ray techniques using structured illumination
#36 | 2016-09-15 ✅ Patent 9,543,109 granted on 2017-01-10X-ray sources using linear accumulation
#37 | 2016-06-23 ✅ Patent 9,823,203 granted on 2017-11-21X-ray surface analysis and measurement apparatus
#38 | 2016-03-10 ✅ Patent 10,349,908 granted on 2019-07-16X-ray interferometric imaging system
#39 | 2016-03-03STRUCTURED TARGETS FOR X-RAY GENERATION
#40 | 2015-12-10 ✅ Patent 9,448,190 granted on 2016-09-20High brightness X-ray absorption spectroscopy system
#41 | 2015-09-17 ✅ Patent 9,874,531 granted on 2018-01-23X-ray method for the measurement, characterization, and analysis of periodic structures
#42 | 2015-09-03 ✅ Patent 9,594,036 granted on 2017-03-14X-ray surface analysis and measurement apparatus
#43 | 2015-08-27 ✅ Patent 9,719,947 granted on 2017-08-01X-ray interferometric imaging system
#44 | 2015-07-09 ✅ Patent 9,449,781 granted on 2016-09-20X-ray illuminators with high flux and high flux density
#45 | 2015-04-23 ✅ Patent 9,390,881 granted on 2016-07-12X-ray sources using linear accumulation
Also check out Sigray, Inc.'s (Concord, United States) applicant profile with 50 patent applications submitted.
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