Berkeley, California
United States
58
2026-06-04
The entities that hold a legal rights for patent applications filed by inventor Kirz Janos:
Janos Kirz from Berkeley, US has applied for patents for these inventions. The list has both pending applications and granted patents:
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE
#2 | 2025-12-04X-RAY SYSTEM WITH ELECTRICALLY INSULATIVE SOURCE TARGET MATERIAL
#3 | 2025-08-21SYSTEM AND METHOD FOR GENERATING A FOCUSED X-RAY BEAM
#4 | 2025-07-24SEQUENTIAL ARRAY OF X-RAY IMAGING DETECTORS
#5 | 2025-07-10X-RAY ANALYSIS SYSTEM WITH FOCUSED X-RAY BEAM AND NON-X-RAY MICROSCOPE
#6 | 2025-05-08SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL INFORMATION FROM TWO ORTHOGONAL PLANES
#7 | 2025-01-23HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE
#8 | 2024-11-28HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY SOURCE
#9 | 2024-08-22X-ray detector system with at least two stacked flat Bragg diffractors
#10 | 2023-11-30High throughput 3D x-ray imaging system using a transmission x-ray source
#11 | 2023-11-02X-ray sequential array wavelength dispersive spectrometer
#12 | 2023-09-21System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
#13 | 2023-09-07X-RAY FLUORESCENCE SYSTEM AND X-RAY SOURCE WITH ELECTRICALLY INSULATIVE TARGET MATERIAL
#14 | 2023-07-13Microfocus x-ray source for generating high flux low energy x-rays
#15 | 2022-06-09High throughput 3D x-ray imaging system using a transmission x-ray source
#16 | 2022-03-17System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
#17 | 2022-03-17System and method using x-rays for depth-resolving metrology and analysis
#18 | 2021-11-18System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
#19 | 2021-11-16X-ray dark-field in-line inspection for semiconductor samples
#20 | 2021-08-12X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
#21 | 2021-03-18System and method for computed laminography x-ray fluorescence imaging
#22 | 2021-01-21X-ray source with rotating anode at atmospheric pressure
#23 | 2020-11-05High brightness x-ray reflection source
#24 | 2020-03-26System and method for depth-selectable x-ray analysis
#25 | 2020-03-05System and method for x-ray fluorescence with filtering
#26 | 2020-02-06Talbot-lau x-ray source and interferometric system
#27 | 2020-01-30High brightness x-ray reflection source
#28 | 2019-12-05Energy-resolving x-ray detection system
#29 | 2019-12-05Wavelength dispersive x-ray spectrometer
#30 | 2019-10-03X-ray emission spectrometer system
#31 | 2019-08-22X-ray imaging system
#32 | 2019-08-15X-ray interrogation system using multiple x-ray beams
#33 | 2019-05-16X-ray spectrometer system
#34 | 2019-03-21X-ray illumination system with multiple target microstructures
#35 | 2019-03-21X-RAY ILLUMINATORS WITH HIGH FLUX AND HIGH FLUX DENSITY
#36 | 2019-01-10Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
#37 | 2018-09-13Talbot X-ray microscope
#38 | 2018-07-19Material measurement techniques using multiple X-ray micro-beams
#39 | 2018-05-24X-ray illumination system with multiple target microstructures
#40 | 2017-11-23X-ray transmission spectrometer system
#41 | 2017-09-14Method and apparatus for x-ray microscopy
#42 | 2017-06-08X-RAY ILLUMINATORS WITH HIGH FLUX AND HIGH FLUX DENSITY
#43 | 2017-02-23Detector for X-rays with high spatial and high spectral resolution
#44 | 2017-02-16X-ray fluorescence system with high flux and high flux density
#45 | 2016-12-01Diverging X-ray sources using linear accumulation
#46 | 2016-11-03X-ray techniques using structured illumination
#47 | 2016-09-15X-ray sources using linear accumulation
#48 | 2016-06-23X-ray surface analysis and measurement apparatus
#49 | 2016-03-10X-ray interferometric imaging system
#50 | 2016-03-03STRUCTURED TARGETS FOR X-RAY GENERATION
#51 | 2015-12-10High brightness X-ray absorption spectroscopy system
#52 | 2015-09-17X-ray method for the measurement, characterization, and analysis of periodic structures
#53 | 2015-09-03X-ray surface analysis and measurement apparatus
#54 | 2015-08-27X-ray interferometric imaging system
#55 | 2015-07-09X-ray illuminators with high flux and high flux density
#56 | 2015-04-30X-RAY INTERFEROMETRIC IMAGING SYSTEM
#57 | 2015-04-23X-ray sources using linear accumulation
#58 | 2015-04-02STRUCTURED TARGETS FOR X-RAY GENERATION
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