Cernusco Lombardone
Italy
54
2025-08-14
52
2025-05-27
These are the the leading inventors for applications assigned to TECHNOPROBE S.P.A.:
TECHNOPROBE S.P.A. based in Cernusco Lombardone, IT has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
#2 | 2024-05-09 ✅ Patent 12,313,655 granted on 2025-05-27Testing head having improved frequency properties
#3 | 2024-01-11 ✅ Patent 12,455,299 granted on 2025-10-28IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENCY ELECTRONIC DEVICES AND RELATING PROBE HEAD
#4 | 2023-12-28 ✅ Patent 12,487,253 granted on 2025-12-02LARGE PROBE HEAD FOR TESTING ELECTRONIC DEVICES AND RELATED MANUFACTURING METHOD
#5 | 2023-12-21 ✅ Patent 12,292,457 granted on 2025-05-06Flexible membrane adapted to carry high-frequency (RF) power signals and corresponding probe card for the high-frequency (RF) power test of electronic devices
#6 | 2023-10-19 ✅ Patent 11,921,133 granted on 2024-03-05Testing head having improved frequency properties
#7 | 2023-10-12TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY
#8 | 2023-10-05 ✅ Patent 12,259,407 granted on 2025-03-25Contact probe for probe heads of electronic devices
#9 | 2023-09-28 ✅ Patent 12,571,838 granted on 2026-03-10PROBE HEAD FOR TESTING ELECTRONIC DEVICES COMPRISING INTEGRATED OPTICAL ELEMENTS
#10 | 2023-01-26 ✅ Patent 12,105,118 granted on 2024-10-01Testing head with an improved contact between contact probes and guide holes
#11 | 2023-01-26 ✅ Patent 12,044,703 granted on 2024-07-23Contact probe for high-frequency applications with improved current capacity
#12 | 2023-01-19 ✅ Patent 11,953,522 granted on 2024-04-09Probe head for reduced-pitch applications
#13 | 2022-05-19 ✅ Patent 12,032,003 granted on 2024-07-09Probe head for electronic devices and corresponding probe card
#14 | 2022-02-03 ✅ Patent 11,971,449 granted on 2024-04-30Probe head for a testing apparatus of electronic devices with enhanced filtering properties
#15 | 2021-10-14 ✅ Patent 11,867,723 granted on 2024-01-09Vertical probe head having an improved contact with a device under test
#16 | 2021-09-02 ✅ Patent 11,668,732 granted on 2023-06-06Testing head having improved frequency properties
#17 | 2021-08-19 ✅ Patent 12,085,588 granted on 2024-09-10Vertical probe head with improved contact properties towards a device under test
#18 | 2021-08-12 ✅ Patent 11,442,080 granted on 2022-09-13Contact probe and relative probe head of an apparatus for testing electronic devices
#19 | 2021-04-29 ✅ Patent 11,415,600 granted on 2022-08-16Probe card for high frequency applications
#20 | 2021-03-04 ✅ Patent 11,402,428 granted on 2022-08-02High-performance probe card in high-frequency
#21 | 2020-12-03 ✅ Patent 12,000,879 granted on 2024-06-04Apparatus for the automated assembly of a probe head
#22 | 2020-12-03 ✅ Patent 11,307,222 granted on 2022-04-19Contact probe for a testing head for testing electronic devices
#23 | 2020-11-05 ✅ Patent 11,307,221 granted on 2022-04-19Cantilever contact probe and corresponding probe head
#24 | 2020-11-05 ✅ Patent 11,333,681 granted on 2022-05-17Cantilever probe head and corresponding contact probe
#25 | 2020-09-17 ✅ Patent 11,549,965 granted on 2023-01-10Contact probe and corresponding testing head of an apparatus for testing electronic devices
#26 | 2020-08-27 ✅ Patent 11,340,262 granted on 2022-05-24Contact probe for a testing head for testing high-frequency devices
#27 | 2020-06-25 ✅ Patent 11,293,941 granted on 2022-04-05Interface element for a testing apparatus of electronic devices and corresponding manufacturing method
#28 | 2020-03-05 ✅ Patent 12,019,111 granted on 2024-06-25Manufacturing method of a multi-layer for a probe card
#29 | 2020-02-20 ✅ Patent 11,209,463 granted on 2021-12-28Probe card for a testing apparatus of electronic devices
#30 | 2019-12-12 ✅ Patent 11,029,337 granted on 2021-06-08Vertical probe testing head with improved frequency properties
#31 | 2019-12-12 ✅ Patent 11,828,774 granted on 2023-11-28Testing head with improved frequency property
#32 | 2019-11-28 ✅ Patent 11,029,336 granted on 2021-06-08Probe card for high-frequency applications
#33 | 2019-11-28 ✅ Patent 11,112,431 granted on 2021-09-07Probe card for high-frequency applications
#34 | 2019-10-03 ✅ Patent 11,163,004 granted on 2021-11-02Probe head for a testing apparatus of electronic devices with enhanced filtering properties
#35 | 2019-10-03 ✅ Patent 11,035,885 granted on 2021-06-15Testing head having improved frequency properties
#36 | 2019-09-26 ✅ Patent 11,016,122 granted on 2021-05-25Contact probe and relative probe head of an apparatus for testing electronic devices
#37 | 2019-04-18 ✅ Patent 10,782,319 granted on 2020-09-22Probe card for electronics devices
#38 | 2018-02-22 ✅ Patent 10,698,003 granted on 2020-06-30Testing head comprising vertical probes for reduced pitch applications
#39 | 2018-01-25 ✅ Patent 10,761,113 granted on 2020-09-01Probe card for a testing apparatus of electronic devices with enhanced filtering properties
#40 | 2018-01-11 ✅ Patent 10,578,646 granted on 2020-03-03Testing head comprising vertical probes with internal openings
#41 | 2018-01-04 ✅ Patent 10,551,433 granted on 2020-02-04Testing head comprising vertical probes
#42 | 2017-10-26 ✅ Patent 11,131,690 granted on 2021-09-28Contact probe for testing head
#43 | 2017-10-26 ✅ Patent 10,401,387 granted on 2019-09-03Manufacturing method of contact probes for a testing head
#44 | 2017-10-19 ✅ Patent 10,365,299 granted on 2019-07-30Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished product
#45 | 2017-03-02 ✅ Patent 10,228,392 granted on 2019-03-12Contact probe for a testing head
#46 | 2016-12-29 ✅ Patent 10,509,056 granted on 2019-12-17Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications
#47 | 2016-12-29 ✅ Patent 10,151,775 granted on 2018-12-11High-planarity probe card for a testing apparatus for electronic devices
#48 | 2015-10-29 ✅ Patent 9,829,508 granted on 2017-11-28Testing head of electronic devices
#49 | 2014-01-16 ✅ Patent 9,069,015 granted on 2015-06-30Interface board of a testing head for a test equipment of electronic devices and corresponding probe head
#50 | 2013-02-28 ✅ Patent 8,981,803 granted on 2015-03-17Method for cleaning a contact pad of a microstructure and corresponding cantilever contact probe and probe testing head
#51 | 2012-11-08 ✅ Patent 9,429,593 granted on 2016-08-30Testing head for a test equipment of electronic devices
#52 | 2012-11-08 ✅ Patent 9,423,421 granted on 2016-08-23Testing head for a test equipment of electronic devices
#53 | 2005-12-08 ✅ Patent 7,227,368 granted on 2007-06-05Testing head contact probe with an eccentric contact tip
#54 | 2005-05-26 ✅ Patent 7,301,354 granted on 2007-11-27Contact probe for a testing head having vertical probes for semiconductor integrated devices
Also check out Technoprobe S.p.A.'s (Cernusco Lombardone, Italy) applicant profile with 51 patent applications submitted.
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