Cernusco Lombardone
Italy
21
2024-01-11
The entities that hold a legal rights for patent applications filed by inventor Crippa Roberto:
Roberto Crippa from Cernusco Lombardone, IT has applied for patents for these inventions. The list has both pending applications and granted patents:
IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENCY ELECTRONIC DEVICES AND RELATING PROBE HEAD
#2 | 2023-10-12TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY
#3 | 2023-09-28PROBE HEAD FOR TESTING ELECTRONIC DEVICES COMPRISING INTEGRATED OPTICAL ELEMENTS
#4 | 2023-01-26Testing head with an improved contact between contact probes and guide holes
#5 | 2023-01-19Probe head for reduced-pitch applications
#6 | 2021-08-12Contact probe and relative probe head of an apparatus for testing electronic devices
#7 | 2020-08-27Contact probe for a testing head for testing high-frequency devices
#8 | 2020-06-25Interface element for a testing apparatus of electronic devices and corresponding manufacturing method
#9 | 2020-03-05Manufacturing method of a multi-layer for a probe card
#10 | 2019-12-12Vertical probe testing head with improved frequency properties
#11 | 2019-12-12Testing head with improved frequency property
#12 | 2019-09-26Contact probe and relative probe head of an apparatus for testing electronic devices
#13 | 2019-04-18Probe card for electronics devices
#14 | 2018-01-04Testing head comprising vertical probes
#15 | 2017-10-19Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished product
#16 | 2017-09-21CONTACT PROBE FOR A TESTING HEAD
#17 | 2017-05-04CONTACT PROBE FOR A TESTING HEAD AND CORRESPONDING MANUFACTURING METHOD
#18 | 2017-03-02Contact probe for a testing head
#19 | 2016-12-29High-planarity probe card for a testing apparatus for electronic devices
#20 | 2015-10-29Testing head of electronic devices
#21 | 2012-11-08Testing head for a test equipment of electronic devices
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