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Assignee profile:

Hitachi High-Technologies, Corp.

City:

Tokyo

Country:

Japan

Published Applications:

19

Last publication date:

2011-11-24

Patent Grants:

17

Last grant date:

2013-03-05

Top Inventors for applications by Hitachi High-Technologies, Corp.

These are the the leading inventors for applications assigned to Hitachi High-Technologies, Corp.:

Recent patent applications by Hitachi High-Technologies, Corp.

Hitachi High-Technologies, Corp. based in Tokyo, JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2011-11-24 ✅ Patent 8,389,959 granted on 2013-03-05
US20110284768A1
Physics

Fluorescence analyzing device and fluorescence analyzing method

 #2 | 2011-05-05
US20110102781A1
Physics

OPTICAL DEFECT INSPECTION APPARATUS

 #3 | 2010-11-11
US20100282414A1
Electricity

PLASMA PROCESSING APPARATUS

 #4 | 2010-06-10 ✅ Patent 7,894,052 granted on 2011-02-22
US20100141936A1
Physics

Optical defect inspection apparatus

 #5 | 2010-01-28 ✅ Patent 8,094,298 granted on 2012-01-10
US20100020315A1
Physics

Method for detecting particles and defects and inspection equipment thereof

 #6 | 2008-07-15 ✅ Patent 7,400,984 granted on 2008-07-15
US10822715
-

Biomagnetic measurement apparatus

 #7 | 2008-01-31 ✅ Patent 7,420,168 granted on 2008-09-02
US20080023627A1
Electricity

Scanning electron microscope and CD measurement calibration standard specimen

 #8 | 2007-08-09 ✅ Patent 7,521,703 granted on 2009-04-21
US20070181787A1
Physics

Automatic analyzer

 #9 | 2007-03-20 ✅ Patent 7,193,413 granted on 2007-03-20
US10855374
-

Magnetic field measurement apparatus

 #10 | 2006-11-09 ✅ Patent 7,368,729 granted on 2008-05-06
US20060249697A1
Electricity

Method, apparatus and system for specimen fabrication by using an ion beam

 #11 | 2006-10-19 ✅ Patent 7,582,885 granted on 2009-09-01
US20060231773A1
Electricity

Charged particle beam apparatus

 #12 | 2006-08-03 ✅ Patent 7,595,484 granted on 2009-09-29
US20060169889A1
Electricity

Mass spectrometric method, mass spectrometric system, diagnosis system, inspection system, and mass spectrometric program

 #13 | 2006-04-11 ✅ Patent 7,027,935 granted on 2006-04-11
US10634775
-

Sample dispensing apparatus and automatic analyzer using the same

 #14 | 2006-01-31 ✅ Patent 6,992,307 granted on 2006-01-31
US10873250
-

Electron beam source and electron beam exposure apparatus employing the electron beam source

 #15 | 2006-01-19 ✅ Patent 7,214,938 granted on 2007-05-08
US20060011838A1
Physics

Sample observation method and transmission electron microscope

 #16 | 2006-01-12 ✅ Patent 7,341,393 granted on 2008-03-11
US20060006342A1
Electricity

Mechanism for sealing

 #17 | 2006-01-03 ✅ Patent 6,982,420 granted on 2006-01-03
US10720251
-

Sample observation method and transmission electron microscope

 #18 | 2005-03-10 ✅ Patent 7,075,076 granted on 2006-07-11
US20050051722A1
Electricity

Inspection system, inspection method, and process management method

 #19 | 2005-01-13 ✅ Patent 7,005,659 granted on 2006-02-28
US20050006601A1
Performing operations; transporting

Charged particle beam exposure apparatus, charged particle beam exposure method, and device manufacturing method using the same apparatus
AssigneeID:

200317 ⎘