Mito
Japan
15
2015-07-02
The entities that hold a legal rights for patent applications filed by inventor NAKAZAWA Eiko:
Eiko NAKAZAWA from Mito, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE
#2 | 2012-11-22Charged particle beam device and sample observation method
#3 | 2012-06-07Specimen observation method
#4 | 2011-08-25Method for observing sample and electronic microscope
#5 | 2011-03-17Charged particle beam device
#6 | 2011-03-10Transmission electron microscope, and method of observing specimen
#7 | 2009-11-05Specimen observation method
#8 | 2009-09-03Charged particle beam device
#9 | 2008-11-20Sample observation method and transmission electron microscope
#10 | 2008-09-18Charged particle beam device
#11 | 2008-03-27Specimen observation method
#12 | 2006-01-19Sample observation method and transmission electron microscope
#13 | 2006-01-03Sample observation method and transmission electron microscope
#14 | 2005-07-07Electron microscope
#15 | 2005-04-05Electron microscope and means to set observation conditions
1214099 ⎘