SCANIMETRICS INC.

City:

Edmonton

Country:

Canada

Published Applications:

Last publication date:

2011-10-20

Patent Grants:

Last grant date:

2013-01-29

Top Inventors for applications by SCANIMETRICS INC.

These are the the leading inventors for applications assigned to SCANIMETRICS INC.:

Brian Moore 4 Edmonton, Canada
Steven Slupsky 3 Edmonton, Canada
Christopher V. Sellathamby 2 Edmonton, Canada
Steven Harold Slupsky 2 Edmonton, Canada

Raymond George Decorby 1 Edmonton, Canada
Christopher Sellathamby 1 Edmonton, Canada
Steven H. Slupsky 1 Edmonton, Canada
Brian Moore 1 Edmonton, AB Canada

Recent patent applications by SCANIMETRICS INC.

SCANIMETRICS INC. based in Edmonton, CA has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2011-10-20 ✅ Patent 8,362,481 granted on 2013-01-29

US20110254123A1

Electricity

Ultra high speed signal transmission/reception

#2 | 2009-08-13 ✅ Patent 8,125,237 granted on 2012-02-28

US20090201042A1

Electricity

Thin film transistor array having test circuitry

#3 | 2009-03-12 ✅ Patent 8,373,429 granted on 2013-02-12

US20090066356A1

Physics

Method and apparatus for interrogating an electronic component

#4 | 2007-07-12 ✅ Patent 8,028,208 granted on 2011-09-27

US20070162801A1

Physics

Wireless radio frequency technique design and method for testing of integrated circuits and wafers

#5 | 2007-02-27 ✅ Patent 7,183,788 granted on 2007-02-27

US10788491

Wireless radio frequency technique design and method for testing of integrated circuits and wafers

#6 | 2006-03-30 ✅ Patent 7,109,730 granted on 2006-09-19

US20060066326A1

Physics

Non-contact tester for electronic circuits

#7 | 2005-04-26 ✅ Patent 6,885,202 granted on 2005-04-26

US10666553

Non-contact tester for electronic circuits

Also check out Scanimetrics Inc.'s (Edmonton, Canada) applicant profile with 1 patent applications submitted.

AssigneeID:

207002 ⎘