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Inventor profile of:

Steven Slupsky

City:

Edmonton

Country:

Canada

Published Applications:

Last publication date:

2015-11-12

Top Assignees for applications by Steven Slupsky

The entities that hold a legal rights for patent applications filed by inventor Slupsky Steven:

Scanimetrics Inc. 7 Edmonton ,AB, Canada
Scanimetrics Inc. 5 Edmonton, Alberta, Canada
SCANIMETRICS INC. 3 Edmonton, Canada

Recent patent applications by Slupsky Steven

Steven Slupsky from Edmonton, CA has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2015-11-12

US20150323435A1

Physics

Containment integrity sensor device

#2 | 2015-10-01

US20150276805A1

Physics

TESTING OF ELECTRONIC CIRCUITS USING AN ACTIVE PROBE INTEGRATED CIRCUIT

#3 | 2013-10-24

US20130278377A1

Physics

Wireless sensor device

#4 | 2013-08-15

US20130207681A1

Physics

METHOD AND APPARATUS FOR INTERROGATING AN ELECTRONIC COMPONENT

#5 | 2013-05-30

US20130135041A1

Electricity

Interconnect having ultra high speed signal transmission/reception

#6 | 2011-10-20

US20110254123A1

Electricity

Ultra high speed signal transmission/reception

#7 | 2011-03-10

US20110057291A1

Electricity

Ultra high speed signal transmission/reception interconnect

#8 | 2011-01-13

US20110006794A1

Physics

Method and apparatus for interrogating electronic equipment components

#9 | 2010-07-01

US20100164519A1

Physics

Testing of electronic circuits using an active probe integrated circuit

#10 | 2009-08-13

US20090201042A1

Electricity

Thin film transistor array having test circuitry

#11 | 2009-03-19

US20090072843A1

Physics

Method and apparatus for interrogating an electronic component

#12 | 2009-03-12

US20090066356A1

Physics

Method and apparatus for interrogating an electronic component

InventorID:

385635 ⎘