Berlin
Germany
16
2011-12-08
15
2014-11-25
These are the the leading inventors for applications assigned to JPK INSTRUMENTS AG:
JPK INSTRUMENTS AG based in Berlin, DE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Method and Device for Examining a Sample with a Probe Microscope
#2 | 2010-10-14 ✅ Patent 8,898,809 granted on 2014-11-25Method and apparatus for the combined analysis of a sample with objects to be analyzed
#3 | 2010-10-14 ✅ Patent 8,505,109 granted on 2013-08-06Measuring probe device for a probe microscope, measuring cell and scanning probe microscope
#4 | 2010-09-30 ✅ Patent 8,415,613 granted on 2013-04-09Method and apparatus for characterizing a sample with two or more optical traps
#5 | 2010-08-26 ✅ Patent 8,381,311 granted on 2013-02-19Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system
#6 | 2010-02-11 ✅ Patent 9,018,018 granted on 2015-04-28Method and apparatus for determining the cell activation of a target cell by an activator
#7 | 2009-12-03 ✅ Patent 7,971,266 granted on 2011-06-28Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope
#8 | 2009-08-13 ✅ Patent 8,769,711 granted on 2014-07-01Method for examining a measurement object, and apparatus
#9 | 2009-06-04 ✅ Patent 7,934,323 granted on 2011-05-03Method and a device for the positioning of a displaceable component in an examining system
#10 | 2008-07-10 ✅ Patent 8,506,909 granted on 2013-08-13Device for receiving a test sample
#11 | 2007-01-02 ✅ Patent 7,155,962 granted on 2007-01-02Method and apparatus to study a surfactant
#12 | 2006-07-27 ✅ Patent 7,473,894 granted on 2009-01-06Apparatus and method for a scanning probe microscope
#13 | 2006-05-11 ✅ Patent 7,442,922 granted on 2008-10-28Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology
#14 | 2005-03-24 ✅ Patent 7,022,985 granted on 2006-04-04Apparatus and method for a scanning probe microscope
#15 | 2005-02-03 ✅ Patent 6,998,602 granted on 2006-02-14Method of and an apparatus for measuring a specimen by means of a scanning probe microscope
#16 | 2005-01-27 ✅ Patent 7,114,405 granted on 2006-10-03Probe mounting device for a scanning probe microscope
Also check out JPK INSTRUMENTS AG's (Berlin, Germany) applicant profile with 1 patent applications submitted.
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