Berlin
Germany
9
2022-08-04
The entities that hold a legal rights for patent applications filed by inventor Jähnke Torsten:
Torsten Jähnke from Berlin, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating
#2 | 2019-06-06Measuring device for a scanning probe microscope, scanning probe microscope and method for operating the scanning probe microscope
#3 | 2014-01-16Apparatus and a method for investigating a sample by means of several investigation methods
#4 | 2010-10-14Method and apparatus for the combined analysis of a sample with objects to be analyzed
#5 | 2010-10-14Measuring probe device for a probe microscope, measuring cell and scanning probe microscope
#6 | 2010-08-26Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe system
#7 | 2009-12-03Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope
#8 | 2006-07-27Apparatus and method for a scanning probe microscope
#9 | 2005-03-24Apparatus and method for a scanning probe microscope
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