NANOPHOTONICS AG

City:

Mainz

Country:

Germany

Published Applications:

Last publication date:

2010-08-05

Patent Grants:

Last grant date:

2012-10-16

Top Inventors for applications by NANOPHOTONICS AG

These are the the leading inventors for applications assigned to NANOPHOTONICS AG:

Michael Abraham 4 Mainz, Germany
Holger Wenz 2 Ludwigshafen, Germany
Dietrich Drews 1 Selzen, Germany
Ivo J M M Raaijmakers 1 Bilthoven, Netherlands

Pierre Astegno 1 Saint Jory, France
Sönke Siebert 1 Heidelberg, Germany
Michael Schweiger 1 Orlamunde, Germany
Eckhard Marx 1 Radeburg, Germany

Andreas Lang 1 Frankfurt, Germany
Alain Gaudon 1 Launac, France

Recent patent applications by NANOPHOTONICS AG

NANOPHOTONICS AG based in Mainz, DE has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2010-08-05 ✅ Patent 8,289,509 granted on 2012-10-16

US20100195097A1

Physics

Inspection device and inspection method for the optical examination of object surfaces, particularly of wafer surfaces

#2 | 2010-01-07 ✅ Patent 8,444,126 granted on 2013-05-21

US20100001449A1

Electricity

Holding and turning device for touch-sensitive flat objects

#3 | 2006-04-18 ✅ Patent 7,030,401 granted on 2006-04-18

US10257776

Modular substrate measurement system

#4 | 2005-10-11 ✅ Patent 6,954,267 granted on 2005-10-11

US10237909

Device for measuring surface defects

#5 | 2005-08-30 ✅ Patent 6,935,201 granted on 2005-08-30

US10638599

Measurement configuration including a vehicle and method for performing measurements with the measurement configuration at various locations

#6 | 2005-05-10 ✅ Patent 6,891,609 granted on 2005-05-10

US10120639

Measurement box with module for measuring wafer characteristics

AssigneeID:

223121 ⎘