Michael Abraham

City:

Mainz

Country:

Germany

Published Applications:

Last publication date:

2006-04-18

Top Assignees for applications by Michael Abraham

The entities that hold a legal rights for patent applications filed by inventor Abraham Michael:

Michael Abraham from Mainz, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Modular substrate measurement system

Device for measuring surface defects

Measurement configuration including a vehicle and method for performing measurements with the measurement configuration at various locations

Measurement box with module for measuring wafer characteristics

InventorID:

7432936 ⎘