Patents-Review.com
🔗 Permalink
Assignee profile:

VEECO INSTRUMENTS, INC.

City:

Tucson, Arizona

Country:

United States

Published Applications:

16

Last publication date:

2011-06-07

Patent Grants:

16

Last grant date:

2011-06-07

Top Inventors for applications by VEECO INSTRUMENTS, INC.

These are the the leading inventors for applications assigned to VEECO INSTRUMENTS, INC.:

Recent patent applications by VEECO INSTRUMENTS, INC.

VEECO INSTRUMENTS, INC. based in Tucson, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2011-06-07 ✅ Patent 7,956,630 granted on 2011-06-07
US12766744
-

Real-time effective-wavelength error correction for HDVSI

 #2 | 2011-03-01 ✅ Patent 7,898,672 granted on 2011-03-01
US12082846
-

Real-time scanner-nonlinearity error correction for HDVSI

 #3 | 2011-01-04 ✅ Patent 7,864,327 granted on 2011-01-04
US12351639
-

In-phase/in-quadrature demodulator for spectral information of interference signal

 #4 | 2009-10-20 ✅ Patent 7,605,925 granted on 2009-10-20
US11473447
-

High-definition vertical-scan interferometry

 #5 | 2009-07-23 ✅ Patent 7,808,652 granted on 2010-10-05
US20090185193A1
Physics

Interferometric measurement of DLC layer on magnetic head

 #6 | 2009-01-15 ✅ Patent 7,505,863 granted on 2009-03-17
US20090018786A1
Physics

Interferometric iterative technique with bandwidth and numerical-aperture dependency

 #7 | 2009-01-01 ✅ Patent 8,213,021 granted on 2012-07-03
US20090002775A1
Physics

Interferometric measurement of non-homogeneous multi-material surfaces

 #8 | 2008-09-11 ✅ Patent 7,654,685 granted on 2010-02-02
US20080218999A1
Physics

Variable-wavelength illumination system for interferometry

 #9 | 2007-06-21 ✅ Patent 7,612,891 granted on 2009-11-03
US20070139656A1
Physics

Measurement of thin films using fourier amplitude

 #10 | 2006-06-08 ✅ Patent 7,212,356 granted on 2007-05-01
US20060120088A1
Physics

Mounting mechanism for compensating optics in interferometer

 #11 | 2006-06-08 ✅ Patent 7,375,821 granted on 2008-05-20
US20060119862A1
Physics

Profilometry through dispersive medium using collimated light with compensating optics

 #12 | 2006-03-21 ✅ Patent 7,016,050 granted on 2006-03-21
US10426349
-

Microscope with fixed-element autocollimator for tilt adjustment

 #13 | 2006-01-17 ✅ Patent 6,987,570 granted on 2006-01-17
US10109361
-

Reference signal for stitching of interferometric profiles

 #14 | 2005-12-22 ✅ Patent 7,119,909 granted on 2006-10-10
US20050280829A1
Physics

Film thickness and boundary characterization by interferometric profilometry

 #15 | 2005-07-21 ✅ Patent 7,283,250 granted on 2007-10-16
US20050157306A1
Physics

Measurement of object deformation with optical profiler

 #16 | 2005-01-25 ✅ Patent 6,847,460 granted on 2005-01-25
US10262057
-

Alignment and correction template for optical profilometric measurement
AssigneeID:

239726 ⎘