Tucson, Arizona
United States
17
2016-09-13
The entities that hold a legal rights for patent applications filed by inventor CHEN DONG:
DONG CHEN from Tucson, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Edge electrode for characterization of semiconductor wafers
#2 | 2015-11-03Probe and method of manufacture for semiconductor wafer characterization
#3 | 2015-09-17PREDICTING LED PARAMETERS FROM ELECTROLUMINESCENT SEMICONDUCTOR WAFER TESTING
#4 | 2014-02-04Interferometric technique for measuring patterned sapphire substrates
#5 | 2013-02-21Predicting LED parameters from electroluminescent semiconductor wafer testing
#6 | 2013-02-21Testing of electroluminescent semiconductor wafers
#7 | 2012-10-11Interferometric measurement of non-homogeneous multi-material surfaces
#8 | 2012-10-11Interferometric measurement of non-homogeneous multi-material surfaces
#9 | 2011-06-07Real-time effective-wavelength error correction for HDVSI
#10 | 2011-03-01Real-time scanner-nonlinearity error correction for HDVSI
#11 | 2011-01-04In-phase/in-quadrature demodulator for spectral information of interference signal
#12 | 2009-10-20High-definition vertical-scan interferometry
#13 | 2009-07-23Interferometric measurement of DLC layer on magnetic head
#14 | 2009-01-01Interferometric measurement of non-homogeneous multi-material surfaces
#15 | 2006-08-17Capacitance probe for thin dielectric film characterization
#16 | 2006-08-03Scan data collection for better overall data accurancy
#17 | 2006-02-21Capacitance probe for thin dielectric film characterization
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