Optimal Test Ltd.

City:

Nes-Zionna

Country:

Israel

Published Applications:

Last publication date:

2009-01-08

Patent Grants:

Last grant date:

2009-05-05

Top Inventors for applications by Optimal Test Ltd.

These are the the leading inventors for applications assigned to Optimal Test Ltd.:

Reed Linde 2 El Dorado Hills, CA United States
Gil Balog 2 Jerusalem, Israel
Eran ROUSSEAU 1 Rehovot, Israel
Avi Golan 1 Tel Aviiv, Israel

Igal GURVITS 1 Mazkeret Batya, Israel
Avi Golan 1 Tel Aviv, Israel

Recent patent applications by Optimal Test Ltd.

Optimal Test Ltd. based in Nes-Zionna, IL has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2009-01-08

US20090013218A1

Physics

DATALOG MANAGEMENT IN SEMICONDUCTOR TESTING

#2 | 2007-06-14 ✅ Patent 7,528,622 granted on 2009-05-05

US20070132477A1

Physics

Methods for slow test time detection of an integrated circuit during parallel testing

AssigneeID:

240450 ⎘