Jerusalem
Israel
17
2015-01-08
The entities that hold a legal rights for patent applications filed by inventor Balog Gil:
Gil Balog from Jerusalem, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
Systems and methods for test time outlier detection and correction in integrated circuit testing
#2 | 2013-08-01Systems and methods for test time outlier detection and correction in integrated circuit testing
#3 | 2012-05-03METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENARIO LANGUAGE
#4 | 2011-10-13System and methods for parametric testing
#5 | 2011-09-15Systems and methods for test time outlier detection and correction in integrated circuit testing
#6 | 2010-06-24System and methods for parametric test time reduction
#7 | 2009-10-22Methods and systems for semiconductor testing using a testing scenario language
#8 | 2009-07-30Systems and methods for test time outlier detection and correction in integrated circuit testing
#9 | 2009-05-07Methods and systems for semiconductor testing using reference dice
#10 | 2009-05-07Methods and systems for semiconductor testing using reference dice
#11 | 2009-04-30Methods and systems for semiconductor testing using reference dice
#12 | 2009-01-08DATALOG MANAGEMENT IN SEMICONDUCTOR TESTING
#13 | 2008-05-15Augmenting semiconductor's devices quality and reliability
#14 | 2008-01-10Methods and systems for semiconductor testing using reference dice
#15 | 2007-10-04Methods and systems for semiconductor testing using a testing scenario language
#16 | 2007-06-14Methods for slow test time detection of an integrated circuit during parallel testing
#17 | 2006-11-30Augmenting semiconductor's devices quality and reliability
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