Concord, California
United States
37
2011-07-05
34
2011-07-05
These are the the leading inventors for applications assigned to XRADIA, INC.:
XRADIA, INC. based in Concord, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Metrology and registration system and method for laminography and tomography
#2 | 2010-10-12 ✅ Patent 7,813,475 granted on 2010-10-12X-ray microscope with switchable x-ray source
#3 | 2010-09-14 ✅ Patent 7,796,725 granted on 2010-09-14Mechanism for switching sources in x-ray microscope
#4 | 2010-08-31 ✅ Patent 7,787,588 granted on 2010-08-31System and method for quantitative reconstruction of Zernike phase-contrast images
#5 | 2009-03-12 ✅ Patent 8,267,388 granted on 2012-09-18Alignment assembly
#6 | 2008-12-18 ✅ Patent 7,535,193 granted on 2009-05-19Five axis compensated rotating stage
#7 | 2008-11-06 ✅ Patent 7,920,676 granted on 2011-04-05CD-GISAXS system and method
#8 | 2008-10-28 ✅ Patent 7,443,953 granted on 2008-10-28Structured anode X-ray source for X-ray microscopy
#9 | 2008-08-28 ✅ Patent 7,561,662 granted on 2009-07-14X-ray micro-tomography system optimized for high resolution, throughput, image quality
#10 | 2008-08-14 ✅ Patent 7,864,426 granted on 2011-01-04High aspect-ratio X-ray diffractive structure stabilization methods and systems
#11 | 2008-08-12 ✅ Patent 7,412,024 granted on 2008-08-12X-ray mammography
#12 | 2008-07-29 ✅ Patent 7,406,151 granted on 2008-07-29X-ray microscope with microfocus source and Wolter condenser
#13 | 2008-07-15 ✅ Patent 7,400,704 granted on 2008-07-15High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
#14 | 2008-07-10 ✅ Patent 7,499,521 granted on 2009-03-03System and method for fuel cell material x-ray analysis
#15 | 2008-07-01 ✅ Patent 7,394,890 granted on 2008-07-01Optimized x-ray energy for high resolution imaging of integrated circuits structures
#16 | 2008-04-29 ✅ Patent 7,365,918 granted on 2008-04-29Fast x-ray lenses and fabrication method therefor
#17 | 2008-04-29 ✅ Patent 7,365,909 granted on 2008-04-29Fabrication methods for micro compounds optics
#18 | 2008-04-24Fabrication Methods for Micro Compound Optics
#19 | 2007-09-11 ✅ Patent 7,268,945 granted on 2007-09-11Short wavelength metrology imaging system
#20 | 2007-07-17 ✅ Patent 7,245,696 granted on 2007-07-17Element-specific X-ray fluorescence microscope and method of operation
#21 | 2007-06-28 ✅ Patent 7,388,942 granted on 2008-06-17X-ray micro-tomography system optimized for high resolution, throughput, image quality
#22 | 2007-05-17Tunable x-ray fluorescence imager for multi-element analysis
#23 | 2007-05-08 ✅ Patent 7,215,736 granted on 2007-05-08X-ray micro-tomography system optimized for high resolution, throughput, image quality
#24 | 2007-01-30 ✅ Patent 7,170,969 granted on 2007-01-30X-ray microscope capillary condenser system
#25 | 2007-01-04 ✅ Patent 7,414,787 granted on 2008-08-19Phase contrast microscope for short wavelength radiation and imaging method
#26 | 2006-10-31 ✅ Patent 7,130,375 granted on 2006-10-31High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
#27 | 2006-10-10 ✅ Patent 7,119,953 granted on 2006-10-10Phase contrast microscope for short wavelength radiation and imaging method
#28 | 2006-08-31 ✅ Patent 7,297,959 granted on 2007-11-20Lens bonded X-ray scintillator system and manufacturing method therefor
#29 | 2006-08-22 ✅ Patent 7,095,822 granted on 2006-08-22Near-field X-ray fluorescence microprobe
#30 | 2006-07-27 ✅ Patent 7,800,072 granted on 2010-09-21Low pass X-ray scintillator system
#31 | 2006-06-06 ✅ Patent 7,057,187 granted on 2006-06-06Scintillator optical system and method of manufacture
#32 | 2005-12-22Back-end-of-line metallization inspection and metrology microscopy system and method using x-ray fluorescence
#33 | 2005-10-13 ✅ Patent 7,286,640 granted on 2007-10-23Dual-band detector system for x-ray imaging of biological samples
#34 | 2005-08-04 ✅ Patent 6,917,472 granted on 2005-07-12Achromatic fresnel optics for ultraviolet and x-ray radiation
#35 | 2005-07-05 ✅ Patent 6,914,723 granted on 2005-07-05Reflective lithography mask inspection tool based on achromatic Fresnel optics
#36 | 2005-05-26 ✅ Patent 7,183,547 granted on 2007-02-27Element-specific X-ray fluorescence microscope and method of operation
#37 | 2005-04-26 ✅ Patent 6,885,503 granted on 2005-04-26Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations
244052 ⎘