Albany, California
United States
4
2008-07-15
The entities that hold a legal rights for patent applications filed by inventor Duewer Frederick William:
Frederick William Duewer from Albany, US has applied for patents for these inventions. The list has both pending applications and granted patents:
High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
#2 | 2008-07-01Optimized x-ray energy for high resolution imaging of integrated circuits structures
#3 | 2007-01-30X-ray microscope capillary condenser system
#4 | 2006-10-31High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
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